Mound formation in surface growth under shadowing

被引:86
作者
Pelliccione, M. [1 ]
Karabacak, T.
Gaire, C.
Wang, G. -C.
Lu, T. -M.
机构
[1] Rensselaer Polytech Inst, Dept Phys Appl Phys & Astron, Troy, NY 12180 USA
[2] Rensselaer Polytech Inst, Ctr Integrated Elect, Troy, NY 12180 USA
来源
PHYSICAL REVIEW B | 2006年 / 74卷 / 12期
关键词
D O I
10.1103/PhysRevB.74.125420
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this paper we report on the morphological evolution of thin films grown by commonly employed deposition techniques, such as sputtering and chemical vapor deposition. In these deposition techniques, an angular distribution of incident particle flux leads to the shadowing effect, which often plays an important role in defining the growth front morphology. We show both by simulations and experiments that a mounded structure can be formed with a characteristic length scale, or "wavelength" lambda, which describes the separation of the mounds. We also show that the temporal evolution of lambda is distinctly different from that of the mound size or lateral correlation length xi. The wavelength grows as a function of time in a power-law form, lambda similar to t(p), where p approximate to 0.5 for a wide range of growth conditions, while the mound size grows as xi similar to t(1/z), where 1/z varies depending on growth conditions. The existence of these two length scales and their different growth rates leads to a breakdown of the self-affine and dynamic scaling hypotheses that have been used to describe many surface growth phenomena in the past.
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页数:10
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