OPTICAL CONSTANTS OF BRUSH ELECTRODEPOSITED CuInTe2 FILMS

被引:0
作者
Muthusamy, P. [1 ]
Panneerselvam, A. [2 ]
机构
[1] Anna Univ, Chennai 600025, Tamil Nadu, India
[2] Paavai Engn Coll, Dept Phys, Pachal 637018, India
来源
CHALCOGENIDE LETTERS | 2019年 / 16卷 / 05期
关键词
Semiconductor; Thin films; Electronic material; Optical properties; THIN-FILMS;
D O I
暂无
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Electrodeposition method has been used to deposit of CuInTe(2)thin films on transparent glass substrate with thickness range from 200 to 400 nm at various temperatures ranging from 30 degrees to 80 degrees C by using the brush. UV visible spectrometer was used to record the transmission spectra of CuInTe2 thin films in the wavelength rangebetween 900 to 1800 nm. It is revealed that the optical energy gap (Eg)is increased from 0.96 eV to 1.01 eV when the substrate temperature decreases. The variation in refractive index and extinction coefficient with photon energy werestudied and material properties such as dielectric constant, plasma frequency, and carrier density to effective mass, dispersion, oscillator energy and optical moments were estimated.
引用
收藏
页码:249 / 255
页数:7
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