Microresonator Defects as Sources of Drifting Cavity Solitons

被引：36

作者：

Caboche, E. ^{[1
]}

Pedaci, F. ^{[1
]}

Genevet, P. ^{[1
]}

Barland, S. ^{[1
]}

Giudici, M. ^{[1
]}

Tredicce, J. ^{[1
]}

Tissoni, G. ^{[2
,3
]}

Lugiato, L. A. ^{[2
,3
]}

机构：

[1] Univ Nice Sophia Antipolis, Com Natl Rech Sci, UMR 6618, Inst Nonlineaire Nice, F-06560 Valbonne, France

[2] Univ Insubria, CNR, INFM, I-22100 Como, Italy

[3] Univ Insubria, Dipartimento Matemat & Fis, CNISM, I-22100 Como, Italy

来源：

PHYSICAL REVIEW LETTERS | 2009年 / 102卷 / 16期

关键词：

LOCALIZED STRUCTURES; SEMICONDUCTOR MICROCAVITIES; SYSTEM; PATTERNS; PIXELS; SPOTS;

D O I：

10.1103/PhysRevLett.102.163901

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Cavity solitons (CS) are localized structures appearing as single intensity peaks in the homogeneous background of the field emitted by a nonlinear (micro)resonator. In real devices, their position is strongly influenced by the presence of defects in the device structure. In this Letter we show that the interplay between these defects and a phase gradient in the driving field induces the spontaneous formation of a regular sequence of CSs moving in the gradient direction. Hence, defects behave as a device built-in CS source, where the CS generation rate can be set by controlling the system parameters.

引用

页数：4

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