Snubber resistor influence in the thyristor valves failure on the static VAR compensator

被引:16
作者
Arias Velasquez, Ricardo Manuel [1 ]
Mejia Lara, Jennifer Vanessa [1 ]
机构
[1] Pontificia Univ Catolica Peru, Doctoral Engn Program, Lima, Peru
关键词
Failure; SVC; Snubber resistor; Thyristor; RELIABILITY;
D O I
10.1016/j.engfailanal.2018.03.001
中图分类号
TH [机械、仪表工业];
学科分类号
0802 ;
摘要
In this research, a complex engineering failure analysis is done for a static VAR compensator (SVC), it was installed in Peru 220 kV system. The research introduce the selected results of the simulations and field tests completed during the fault, mitigation and corrective activities performed at the thyristor valve, which is installed in the thyristor switched capacitor (TSC) and thyristor controlled reactor (TCR) of the SVC. This paper proposes the most feasible solution to overcome the failure of the TSC based on snubber resistor in the SVC. In order to investigate the causes of this failure, various measurements were carried out on the TSC. It was concluded that a snubber resistor design needs two special test for determinate a problem or abnormal condition; a special test should be done in the factory acceptance test (FAT), site acceptance test (SAT) and to execute a maintenance diagnosis, to prevent a failure in the thyristor valve from TSC. This failure has happened in the standby system, the susceptance reference is forced to follow the susceptance reference received from the active system. There is however, a delay in the transfer of data from the active to the standby system. During transient conditions this may cause a difference in thyristor firing angles between the systems. The simulated current in the standby system does not agree with the measured current, which is controlled by the active system, an advanced diagnosis and design review is developed for to avoid a sudden failure. The feasibility of these solutions was verified through the computer simulation with PSCAD/EMTDC.
引用
收藏
页码:150 / 176
页数:27
相关论文
共 29 条
[1]  
Alvarez-Alvarado M.S., 2017, 2017 IEEE Second Ecuador Technical Chapters Meeting (ETCM), P1
[2]  
[Anonymous], 2016, 2016 13 INT C ELECT, DOI DOI 10.1109/ECTICON.2016.7560903
[3]  
[Anonymous], 2014, IEEE Std 1687-2014, DOI [DOI 10.1109/IEEESTD.2014.6804630, 10.1109/IEEESTD.2014.6755433, DOI 10.1109/IEEESTD.2014.6837414]
[4]  
Velásquez RMA, 2017, FUZZY INF ENG, V9, P493, DOI 10.1016/j.fiae.2017.12.005
[5]   Ruptures in overhead ground wire - Transmission line 220 kV [J].
Arias Velasquez, Ricardo Manuel ;
Mejia Lara, Jennifer Vanessa .
ENGINEERING FAILURE ANALYSIS, 2018, 87 :1-14
[6]   Life estimation of shunt power reactors considering a failure core heating by floating potentials [J].
Arias Velasquez, Ricardo Manuel ;
Mejia Lara, Jennifer Vanessa .
ENGINEERING FAILURE ANALYSIS, 2018, 86 :142-157
[7]   The need of creating a new nominal creepage distance in accordance with heaviest pollution 500 kV overhead line insulators [J].
Arias Velasquez, Ricardo Manuel ;
Mejia Lara, Jennifer Vanessa .
ENGINEERING FAILURE ANALYSIS, 2018, 86 :21-32
[8]   Reliability, availability and maintainability study for failure analysis in series capacitor bank [J].
Arias Velasquez, Ricardo Manuel ;
Mejia Lara, Jennifer Vanessa .
ENGINEERING FAILURE ANALYSIS, 2018, 86 :158-167
[9]  
Cao Junci, 2010, 2010 14th Biennial IEEE Conference on Electromagnetic Field Computation (CEFC 2010), DOI 10.1109/CEFC.2010.5481194
[10]  
Farsadi M, 2017, 2017 10TH INTERNATIONAL CONFERENCE ON ELECTRICAL AND ELECTRONICS ENGINEERING (ELECO), P1475