Controlled variation of the information depth by angle dependent soft X-ray emission spectroscopy: A study on polycrystalline Cu(In,Ga)Se2

被引：6

作者：

Moenig, H. ^{[1
]}

Lauermann, I. ^{[2
]}

Grimm, A. ^{[2
]}

Camus, C. ^{[2
]}

Kaufmann, C. A. ^{[2
]}

Pistor, P. ^{[2
]}

Jung, Ch. ^{[3
]}

Kropp, T. ^{[2
]}

Lux-Steiner, M. C. ^{[1
,2
]}

Fischer, Ch. -H. ^{[1
,2
]}

机构：

[1] Free Univ Berlin, D-14195 Berlin, Germany

[2] Hahn Meitner Inst Berlin GmbH, D-14109 Berlin, Germany

[3] BESSY, D-12489 Berlin, Germany

来源：

APPLIED SURFACE SCIENCE | 2008年 / 255卷 / 05期

关键词：

Information depth; Soft X-ray emission spectroscopy; Synchrotron; Cu(In; Ga)Se-2;

D O I：

10.1016/j.apsusc.2008.07.177

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Angle dependent X-ray emission spectroscopy (AXES) is introduced as a tool for depth dependent composition analysis. A controlled variation of the information depth is demonstrated by changing the geometry from grazing exit to grazing incidence geometry. First results are presented from Cu(In,Ga)Se-2 (CIGSe)-based polycrystalline thin film solar cell bi-layer components. A mathematical model explains changes in relative intensity due to the absorption and emission behavior of thin CdS and Zn(S,O) cover layers. The fact that the presented data can be modelled by ideal bi-layer structures, provides both, proof of concept in general and the proof of applicability to the relatively rough layered structures based on CIGSe. In bare CIGSe a homogeneous distribution of Cu and Ga is found in a depth range between 22 and 470 nm. (C) 2008 Elsevier B. V. All rights reserved.

引用

页码：2474 / 2477

页数：4

共 15 条

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