Signatures of the Berry curvature in the frequency dependent interlayer magnetoresistance in tilted magnetic fields

被引:3
|
作者
Wright, Anthony R. [1 ]
McKenzie, Ross H. [1 ]
机构
[1] Univ Queensland, Sch Math & Phys, Brisbane, Qld 4072, Australia
关键词
topological insulators; magnetoresistance; interlayer transport; conductance; TOPOLOGICAL-INSULATOR; ELECTRONIC-PROPERTIES; PHASE; SURFACE;
D O I
10.1088/0953-8984/26/8/085801
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
We show that in a layered metal, the angle dependent, finite frequency, interlayer magnetoresistance is altered due to the presence of a non-zero Berry curvature at the Fermi surface. At zero frequency, we find a conservation law which demands that the 'magic angle' condition for interlayer magnetoresistance extrema as a function of magnetic field tilt angle is essentially both field and Berry curvature independent. In the finite frequency case, however, we find that surprisingly large signatures of a finite Berry curvature occur in the periodic orbit resonances. We outline a method whereby the presence and magnitude of the Berry curvature at the Fermi surface can be extracted.
引用
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页数:6
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