Formation and photoluminescence spectrum of w-GaN powder

被引:23
作者
Li, HD [1 ]
Yang, HB [1 ]
Zou, GT [1 ]
Yu, S [1 ]
Lu, JS [1 ]
Qu, SC [1 ]
Wu, Y [1 ]
机构
[1] JILIN UNIV,KEY LAB MOL SPECTRUM & STRUCT,CHANGCHUN 130023,PEOPLES R CHINA
关键词
D O I
10.1016/S0022-0248(96)00400-9
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Ultrafine gallium nitride (GaN) powder has been synthesized using the direct current (DC) are plasma method. Structural and morphological changes with different reaction gases (N-2, NH3 and N-2-NH3, respectively) were studied by X-ray diffractometry and transmission electron microscopy. GaN powder has a wurtzite structure. Measurement of the band-edge photoluminescence spectrum of w-GaN powder indicated that at room temperature the emission peak was situated at 367 nm.
引用
收藏
页码:307 / 310
页数:4
相关论文
共 12 条
  • [1] ANDRIEVSKI RA, 1994, J MATER SCI, V29, P616
  • [2] CRYSTAL-GROWTH OF GAN BY THE REACTION BETWEEN GALLIUM AND AMMONIA
    ELWELL, D
    FEIGELSON, RS
    SIMKINS, MM
    TILLER, WA
    [J]. JOURNAL OF CRYSTAL GROWTH, 1984, 66 (01) : 45 - 54
  • [3] FAJIEDA S, 1991, JPN J APPL PHYS, V30, pL1665
  • [4] Guinier A, 1963, X-ray Diffraction
  • [5] MOLECULAR-BEAM-EPITAXY GROWTH OF GAN ON GAAS(100) BY USING REACTIVE NITROGEN-SOURCE
    HE, ZQ
    DING, XM
    HOU, XY
    WANG, X
    [J]. APPLIED PHYSICS LETTERS, 1994, 64 (03) : 315 - 317
  • [6] AUGER-ELECTRON SPECTROSCOPY, X-RAY-DIFFRACTION, AND SCANNING ELECTRON-MICROSCOPY OF INN, GAN, AND GA(ASN) FILMS ON GAP AND GAAS(001) SUBSTRATES
    JENKINS, LC
    CHENG, TS
    FOXON, CT
    HOOPER, SE
    ORTON, JW
    NOVIKOV, SV
    TRETYAKOV, VV
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1995, 13 (04): : 1585 - 1590
  • [7] EQUILIBRIUM PRESSURE OF N-2 OVER GAN AND HIGH-PRESSURE SOLUTION GROWTH OF GAN
    KARPINSKI, J
    JUN, J
    POROWSKI, S
    [J]. JOURNAL OF CRYSTAL GROWTH, 1984, 66 (01) : 1 - 10
  • [8] KHAN MA, 1991, APPL PHYS LETT, V58, P526, DOI 10.1063/1.104575
  • [9] EPITAXIAL-GROWTH OF ZINC BLENDE AND WURTZITIC GALLIUM NITRIDE THIN-FILMS ON (001) SILICON
    LEI, T
    FANCIULLI, M
    MOLNAR, RJ
    MOUSTAKAS, TD
    GRAHAM, RJ
    SCANLON, J
    [J]. APPLIED PHYSICS LETTERS, 1991, 59 (08) : 944 - 946
  • [10] MATERIALS SYNTHESIS ON THE BASIS OF ULTRAFINE REFRACTORY COMPOUND POWDERS
    MILLERS, T
    [J]. MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 1993, 168 (02): : 171 - 176