Reversible Online BIST Using Bidirectional BILBO

被引：1

作者：

Chen, Jiaoyan ^{[1
]}

Vasudevan, Dilip P. ^{[2
]}

Popovici, Emanuel ^{[1
,3
]}

Schellekens, Michel ^{[2
]}

机构：

[1] Univ Coll Cork, Dept Microelect, Cork, Ireland

[2] Univ Coll Cork, CEOL, Dept Comp Sci, Cork, Ireland

[3] Univ Coll Cork, CEOL, Cork, Ireland

来源：

PROCEEDINGS OF THE 2010 COMPUTING FRONTIERS CONFERENCE (CF 2010) | 2010年

基金：

爱尔兰科学基金会;

关键词：

Reversible Logic; Testing; BIST; BILBO; LOGIC;

D O I：

10.1145/1787275.1787333

中图分类号：

TP301 [理论、方法];

学科分类号：

081202 ;

摘要：

Test generation for reversible circuits is currently gaining interest due to its feasibility towards quantum implementation and asymptotically zero-power dissipation. A novel BIST (Built-In-Self-Test) method for reversible circuits is proposed in this paper. New bidirectional D-latch and D-flipflop designs are introduced. A Reversible BILBO (Built-in-Logic-Block-Observer) based on conventional BILBO is designed to facilitate the BIST procedure. The complete test procedure is executed and experimental results are analyzed for both stuck at and missing gate faults (MGF) with 100 % fault coverage.

引用

页码：257 / 266

页数：10

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