Transverse Acoustoelectric Effect Applying in Surface Study of GaP:Te(111)

被引:28
作者
Pustelny, B. [1 ]
Pustelny, T. [2 ]
机构
[1] Silesian Tech Univ, Inst Phys, PL-44100 Gliwice, Poland
[2] Silesian Tech Univ, Dept Optoelect, PL-44100 Gliwice, Poland
关键词
GAP;
D O I
10.12693/APhysPolA.116.383
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The possibility of using the transverse acoustoelectric phenomena in experimental investigations of near surface region in semiconductor crystals was discussed. The results of experimental investigations of GaP:Te(111) surfaces by means of the transverse acoustoelectric voltage were presented. Applying the transverse acoustoelectric voltage method, the lifetime tau of minority carrier in the near-surface region and the surface potential V. in GaP:Te(111) surfaces after their different technological treatments were determined.
引用
收藏
页码:383 / 384
页数:2
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