Refraction characteristics of PbTiO3 film in THz range

被引：0
|
作者：
Ma, Zhichao [1 ]
Luo, Chunya [1 ]
Li, Dan [1 ]
Wang, Yulan [1 ]
机构：
[1] Hubei Univ Educ, Hubei Engn Technol Res Ctr Environm Purificat Mat, Sch Architectural & Mat Engn, Wuhan, Peoples R China
来源：
FERROELECTRICS | 2021年 / 571卷 / 01期
关键词：
THz; PbTiO3; tunability; refraction index;
D O I：
10.1080/00150193.2020.1853754
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The refraction characteristics of 50 nm thickness of PbTiO3 (PTO) film pumped by various optical power in terahertz (THz) range is measured by THz time domain spectrum. Experiments indicated that the refraction index was 65-110 in the range of 0.2-1 THz and the tunability reached 36.95% when applied 400 mW optical field. The theoretical analysis revealed that the photorefractive and the photothermal effects is responsible for the refraction index monotonically varied with the optical pump power.
引用
收藏
页码：207 / 213
页数：7
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