Surface/interface roughness effects on magneto-electrical properties of thin films

被引：13
作者：
Palasantzas, G
De Hosson, JTM
Barnas, J
机构：
[1] Adam Mickiewicz Univ, Inst Phys, PL-61614 Poznan, Poland
[2] Univ Groningen, Dept Appl Phys, Ctr Mat Sci, NL-9747 AG Groningen, Netherlands
[3] Univ Groningen, Netherlands Inst Met Res, NL-9747 AG Groningen, Netherlands
[4] Polish Acad Sci, Inst Mol Phys, PL-60179 Poznan, Poland
来源：
SURFACE SCIENCE | 2002年 / 507卷
关键词：
electrical transport (conductivity; resistivity; mobility; etc.); magnetic films; surface structure; morphology; roughness; and; topography; magnetic interfaces;
D O I：
10.1016/S0039-6028(02)01306-7
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
We investigate roughness effects on electrical conductivity and giant magnetoresistance (GMR) in thin films with self-affine roughness, characterized by the r.m.s. roughness amplitude w, the in-plane correlation length xi, and the roughness exponent H. It is shown that dynamic roughening (evolution of the roughness parameters) plays an important role in electrical conductivity of growing films, and consequently also in the GMR. In both cases our theoretical predictions are in qualitative agreement with experimental observations. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：541 / 545
页数：5
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