Surface plasmon enhanced transmission through planar gold quasicrystals fabricated by focused ion beam technique

被引：10

作者：

Xue, Jing ^{[1
]}

Zhou, Wen-Zhe ^{[1
]}

Dong, Bi-Qin ^{[2
]}

Wang, Xu ^{[3
]}

Chen, Yifang ^{[4
]}

Huq, Ejaz ^{[4
]}

Zeng, Wei ^{[3
]}

Qu, Xin-Ping ^{[1
]}

Liu, Ran ^{[1
]}

机构：

[1] Fudan Univ, Dept Microelect, State Key Lab ASIC & Syst, Shanghai 200433, Peoples R China

[2] Fudan Univ, Dept Phys, Shanghai 200433, Peoples R China

[3] Fudan Univ, Natl Microanal Ctr, Shanghai 200433, Peoples R China

[4] Rutherford Appleton Lab, Didcot OX11 0QX, Oxon, England

来源：

MICROELECTRONIC ENGINEERING | 2009年 / 86卷 / 4-6期

关键词：

Surface plasmon; Quasicrystal; Enhanced transmission;

D O I：

10.1016/j.mee.2008.11.090

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We have applied focused ion beam (FIB) technique to fabricate planar quasicrystals in thin gold films. Transmission spectra of these quasicrystals are observed with strong dependence on the lattice parameters, indicating that the resonances can be ascribed to the effect of horizontal surface plasmon (SP) on both metal-air and metal-glass interfaces. Multiple SP modes excited in the quasicrystal give rise to the enhanced transmission in a wide wavelength range. The diffraction pattern through the quasicrystal exhibits 10-fold rotation symmetry and a dense distribution, which is in good agreement with that from the Fourier transform. (c) 2008 Elsevier B.V. All rights reserved.

引用

页码：1131 / 1133

页数：3

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