共 29 条
[1]
Probing the Intrinsic Properties of Exfoliated Graphene: Raman Spectroscopy of Free-Standing Monolayers
[J].
Berciaud, Stephane
;
Ryu, Sunmin
;
Brus, Louis E.
;
Heinz, Tony F.
.
NANO LETTERS,
2009, 9 (01)
:346-352

Berciaud, Stephane
论文数: 0 引用数: 0
h-index: 0
机构:
Columbia Univ, Dept Phys, New York, NY 10027 USA
Columbia Univ, Dept Elect Engn, New York, NY 10027 USA
Columbia Univ, Dept Chem, New York, NY 10027 USA Columbia Univ, Dept Phys, New York, NY 10027 USA

Ryu, Sunmin
论文数: 0 引用数: 0
h-index: 0
机构:
Columbia Univ, Dept Chem, New York, NY 10027 USA Columbia Univ, Dept Phys, New York, NY 10027 USA

Brus, Louis E.
论文数: 0 引用数: 0
h-index: 0
机构:
Columbia Univ, Dept Chem, New York, NY 10027 USA Columbia Univ, Dept Phys, New York, NY 10027 USA

Heinz, Tony F.
论文数: 0 引用数: 0
h-index: 0
机构:
Columbia Univ, Dept Phys, New York, NY 10027 USA
Columbia Univ, Dept Elect Engn, New York, NY 10027 USA Columbia Univ, Dept Phys, New York, NY 10027 USA
[2]
Emerging Zero Modes for Graphene in a Periodic Potential
[J].
Brey, L.
;
Fertig, H. A.
.
PHYSICAL REVIEW LETTERS,
2009, 103 (04)

Brey, L.
论文数: 0 引用数: 0
h-index: 0
机构:
CSIC, Inst Ciencia Mat Madrid, Canto Blanco 28049, Spain CSIC, Inst Ciencia Mat Madrid, Canto Blanco 28049, Spain

Fertig, H. A.
论文数: 0 引用数: 0
h-index: 0
机构:
Indiana Univ, Dept Phys, Bloomington, IN 47405 USA CSIC, Inst Ciencia Mat Madrid, Canto Blanco 28049, Spain
[3]
Raman scattering study of the phonon dispersion in twisted bilayer graphene
[J].
Campos-Delgado, Jessica
;
Cancado, Luiz G.
;
Achete, Carlos A.
;
Jorio, Ado
;
Raskin, Jean-Pierre
.
NANO RESEARCH,
2013, 6 (04)
:269-274

Campos-Delgado, Jessica
论文数: 0 引用数: 0
h-index: 0
机构:
Catholic Univ Louvain, Inst Informat & Commun Technol Elect & Appl Math, B-1348 Louvain, Belgium Catholic Univ Louvain, Inst Informat & Commun Technol Elect & Appl Math, B-1348 Louvain, Belgium

Cancado, Luiz G.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Fed Minas Gerais, Dept Fis, BR-30123970 Belo Horizonte, MG, Brazil Catholic Univ Louvain, Inst Informat & Commun Technol Elect & Appl Math, B-1348 Louvain, Belgium

Achete, Carlos A.
论文数: 0 引用数: 0
h-index: 0
机构:
Inst Nacl Metrol Qualidade & Tecnol INMETRO, Div Mat Metrol, BR-25250020 Xerem, RJ, Brazil Catholic Univ Louvain, Inst Informat & Commun Technol Elect & Appl Math, B-1348 Louvain, Belgium

Jorio, Ado
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Fed Minas Gerais, Dept Fis, BR-30123970 Belo Horizonte, MG, Brazil Catholic Univ Louvain, Inst Informat & Commun Technol Elect & Appl Math, B-1348 Louvain, Belgium

Raskin, Jean-Pierre
论文数: 0 引用数: 0
h-index: 0
机构:
Catholic Univ Louvain, Inst Informat & Commun Technol Elect & Appl Math, B-1348 Louvain, Belgium Catholic Univ Louvain, Inst Informat & Commun Technol Elect & Appl Math, B-1348 Louvain, Belgium
[4]
Quantifying Defects in Graphene via Raman Spectroscopy at Different Excitation Energies
[J].
Cancado, L. G.
;
Jorio, A.
;
Martins Ferreira, E. H.
;
Stavale, F.
;
Achete, C. A.
;
Capaz, R. B.
;
Moutinho, M. V. O.
;
Lombardo, A.
;
Kulmala, T. S.
;
Ferrari, A. C.
.
NANO LETTERS,
2011, 11 (08)
:3190-3196

Cancado, L. G.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Fed Minas Gerais, Dept Fis, BR-30123970 Belo Horizonte, MG, Brazil Univ Fed Minas Gerais, Dept Fis, BR-30123970 Belo Horizonte, MG, Brazil

Jorio, A.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Fed Minas Gerais, Dept Fis, BR-30123970 Belo Horizonte, MG, Brazil Univ Fed Minas Gerais, Dept Fis, BR-30123970 Belo Horizonte, MG, Brazil

Martins Ferreira, E. H.
论文数: 0 引用数: 0
h-index: 0
机构:
Inst Nacl Metrol Normalizacao & Qualidade Ind INM, Div Metrol Mat, BR-25250020 Rio De Janeiro, Brazil Univ Fed Minas Gerais, Dept Fis, BR-30123970 Belo Horizonte, MG, Brazil

Stavale, F.
论文数: 0 引用数: 0
h-index: 0
机构:
Inst Nacl Metrol Normalizacao & Qualidade Ind INM, Div Metrol Mat, BR-25250020 Rio De Janeiro, Brazil Univ Fed Minas Gerais, Dept Fis, BR-30123970 Belo Horizonte, MG, Brazil

Achete, C. A.
论文数: 0 引用数: 0
h-index: 0
机构:
Inst Nacl Metrol Normalizacao & Qualidade Ind INM, Div Metrol Mat, BR-25250020 Rio De Janeiro, Brazil Univ Fed Minas Gerais, Dept Fis, BR-30123970 Belo Horizonte, MG, Brazil

Capaz, R. B.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Fed Rio de Janeiro, Inst Fis, BR-21941972 Rio De Janeiro, Brazil Univ Fed Minas Gerais, Dept Fis, BR-30123970 Belo Horizonte, MG, Brazil

Moutinho, M. V. O.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Fed Rio de Janeiro, Inst Fis, BR-21941972 Rio De Janeiro, Brazil Univ Fed Minas Gerais, Dept Fis, BR-30123970 Belo Horizonte, MG, Brazil

Lombardo, A.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Cambridge, Dept Engn, Cambridge CB3 0FA, England Univ Fed Minas Gerais, Dept Fis, BR-30123970 Belo Horizonte, MG, Brazil

Kulmala, T. S.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Cambridge, Dept Engn, Cambridge CB3 0FA, England Univ Fed Minas Gerais, Dept Fis, BR-30123970 Belo Horizonte, MG, Brazil

Ferrari, A. C.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Cambridge, Dept Engn, Cambridge CB3 0FA, England Univ Fed Minas Gerais, Dept Fis, BR-30123970 Belo Horizonte, MG, Brazil
[5]
Resonance effects on the Raman spectra of graphene superlattices
[J].
Carozo, V.
;
Almeida, C. M.
;
Fragneaud, B.
;
Bede, P. M.
;
Moutinho, M. V. O.
;
Ribeiro-Soares, J.
;
Andrade, N. F.
;
Souza Filho, A. G.
;
Matos, M. J. S.
;
Wang, B.
;
Terrones, M.
;
Capaz, Rodrigo B.
;
Jorio, A.
;
Achete, C. A.
;
Cancado, L. G.
.
PHYSICAL REVIEW B,
2013, 88 (08)

Carozo, V.
论文数: 0 引用数: 0
h-index: 0
机构:
Inst Nacl Metrol Normalizacao & Qualidade Ind INM, Div Metrol Mat, BR-25250020 Duque De Caxias, RJ, Brazil
Univ Fed Rio de Janeiro, Dept Engn Met & Mat, BR-21941972 Rio De Janeiro, RJ, Brazil Inst Nacl Metrol Normalizacao & Qualidade Ind INM, Div Metrol Mat, BR-25250020 Duque De Caxias, RJ, Brazil

Almeida, C. M.
论文数: 0 引用数: 0
h-index: 0
机构:
Inst Nacl Metrol Normalizacao & Qualidade Ind INM, Div Metrol Mat, BR-25250020 Duque De Caxias, RJ, Brazil Inst Nacl Metrol Normalizacao & Qualidade Ind INM, Div Metrol Mat, BR-25250020 Duque De Caxias, RJ, Brazil

Fragneaud, B.
论文数: 0 引用数: 0
h-index: 0
机构:
Inst Nacl Metrol Normalizacao & Qualidade Ind INM, Div Metrol Mat, BR-25250020 Duque De Caxias, RJ, Brazil Inst Nacl Metrol Normalizacao & Qualidade Ind INM, Div Metrol Mat, BR-25250020 Duque De Caxias, RJ, Brazil

Bede, P. M.
论文数: 0 引用数: 0
h-index: 0
机构:
Inst Nacl Metrol Normalizacao & Qualidade Ind INM, Div Metrol Mat, BR-25250020 Duque De Caxias, RJ, Brazil Inst Nacl Metrol Normalizacao & Qualidade Ind INM, Div Metrol Mat, BR-25250020 Duque De Caxias, RJ, Brazil

Moutinho, M. V. O.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Fed Rio de Janeiro, Inst Fis, BR-21941972 Rio De Janeiro, RJ, Brazil Inst Nacl Metrol Normalizacao & Qualidade Ind INM, Div Metrol Mat, BR-25250020 Duque De Caxias, RJ, Brazil

Ribeiro-Soares, J.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Fed Minas Gerais, Dept Fis, BR-30123970 Belo Horizonte, MG, Brazil Inst Nacl Metrol Normalizacao & Qualidade Ind INM, Div Metrol Mat, BR-25250020 Duque De Caxias, RJ, Brazil

Andrade, N. F.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Fed Ceara, Dept Fis, BR-60455760 Fortaleza, CE, Brazil Inst Nacl Metrol Normalizacao & Qualidade Ind INM, Div Metrol Mat, BR-25250020 Duque De Caxias, RJ, Brazil

Souza Filho, A. G.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Fed Ceara, Dept Fis, BR-60455760 Fortaleza, CE, Brazil Inst Nacl Metrol Normalizacao & Qualidade Ind INM, Div Metrol Mat, BR-25250020 Duque De Caxias, RJ, Brazil

Matos, M. J. S.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Fed Minas Gerais, Dept Fis, BR-30123970 Belo Horizonte, MG, Brazil Inst Nacl Metrol Normalizacao & Qualidade Ind INM, Div Metrol Mat, BR-25250020 Duque De Caxias, RJ, Brazil

Wang, B.
论文数: 0 引用数: 0
h-index: 0
机构:
Penn State Univ, Dept Phys, University Pk, PA 16802 USA Inst Nacl Metrol Normalizacao & Qualidade Ind INM, Div Metrol Mat, BR-25250020 Duque De Caxias, RJ, Brazil

Terrones, M.
论文数: 0 引用数: 0
h-index: 0
机构:
Penn State Univ, Dept Phys, University Pk, PA 16802 USA Inst Nacl Metrol Normalizacao & Qualidade Ind INM, Div Metrol Mat, BR-25250020 Duque De Caxias, RJ, Brazil

Capaz, Rodrigo B.
论文数: 0 引用数: 0
h-index: 0
机构:
Inst Nacl Metrol Normalizacao & Qualidade Ind INM, Div Metrol Mat, BR-25250020 Duque De Caxias, RJ, Brazil
Univ Fed Rio de Janeiro, Inst Fis, BR-21941972 Rio De Janeiro, RJ, Brazil Inst Nacl Metrol Normalizacao & Qualidade Ind INM, Div Metrol Mat, BR-25250020 Duque De Caxias, RJ, Brazil

Jorio, A.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Fed Minas Gerais, Dept Fis, BR-30123970 Belo Horizonte, MG, Brazil Inst Nacl Metrol Normalizacao & Qualidade Ind INM, Div Metrol Mat, BR-25250020 Duque De Caxias, RJ, Brazil

Achete, C. A.
论文数: 0 引用数: 0
h-index: 0
机构:
Inst Nacl Metrol Normalizacao & Qualidade Ind INM, Div Metrol Mat, BR-25250020 Duque De Caxias, RJ, Brazil
Univ Fed Rio de Janeiro, Dept Engn Met & Mat, BR-21941972 Rio De Janeiro, RJ, Brazil Inst Nacl Metrol Normalizacao & Qualidade Ind INM, Div Metrol Mat, BR-25250020 Duque De Caxias, RJ, Brazil

Cancado, L. G.
论文数: 0 引用数: 0
h-index: 0
机构:
Inst Nacl Metrol Normalizacao & Qualidade Ind INM, Div Metrol Mat, BR-25250020 Duque De Caxias, RJ, Brazil
Univ Fed Minas Gerais, Dept Fis, BR-30123970 Belo Horizonte, MG, Brazil Inst Nacl Metrol Normalizacao & Qualidade Ind INM, Div Metrol Mat, BR-25250020 Duque De Caxias, RJ, Brazil
[6]
Raman Signature of Graphene Superlattices
[J].
Carozo, Victor
;
Almeida, Clara M.
;
Ferreira, Erlon H. M.
;
Cancado, Luiz Gustavo
;
Achete, Carlos Alberto
;
Jorio, Ado
.
NANO LETTERS,
2011, 11 (11)
:4527-4534

Carozo, Victor
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Fed Rio de Janeiro, Dept Met & Mat Engn, BR-21941972 Rio De Janeiro, Brazil
Inst Nacl Metrol Normalizacao & Qualidade Ind INM, Div Mat Metrol, BR-25250020 Duque De Caxias, RJ, Brazil Univ Fed Rio de Janeiro, Dept Met & Mat Engn, BR-21941972 Rio De Janeiro, Brazil

Almeida, Clara M.
论文数: 0 引用数: 0
h-index: 0
机构:
Inst Nacl Metrol Normalizacao & Qualidade Ind INM, Div Mat Metrol, BR-25250020 Duque De Caxias, RJ, Brazil Univ Fed Rio de Janeiro, Dept Met & Mat Engn, BR-21941972 Rio De Janeiro, Brazil

Ferreira, Erlon H. M.
论文数: 0 引用数: 0
h-index: 0
机构:
Inst Nacl Metrol Normalizacao & Qualidade Ind INM, Div Mat Metrol, BR-25250020 Duque De Caxias, RJ, Brazil Univ Fed Rio de Janeiro, Dept Met & Mat Engn, BR-21941972 Rio De Janeiro, Brazil

Cancado, Luiz Gustavo
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Fed Minas Gerais, Dept Fis, BR-30123970 Belo Horizonte, MG, Brazil Univ Fed Rio de Janeiro, Dept Met & Mat Engn, BR-21941972 Rio De Janeiro, Brazil

Achete, Carlos Alberto
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Fed Rio de Janeiro, Dept Met & Mat Engn, BR-21941972 Rio De Janeiro, Brazil
Inst Nacl Metrol Normalizacao & Qualidade Ind INM, Div Mat Metrol, BR-25250020 Duque De Caxias, RJ, Brazil Univ Fed Rio de Janeiro, Dept Met & Mat Engn, BR-21941972 Rio De Janeiro, Brazil

Jorio, Ado
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Fed Minas Gerais, Dept Fis, BR-30123970 Belo Horizonte, MG, Brazil Univ Fed Rio de Janeiro, Dept Met & Mat Engn, BR-21941972 Rio De Janeiro, Brazil
[7]
Casiraghi C, 2012, SPEC PER REP SPECTRO, V43, P29, DOI 10.1039/9781849734899-00029
[8]
Boron nitride substrates for high-quality graphene electronics
[J].
Dean, C. R.
;
Young, A. F.
;
Meric, I.
;
Lee, C.
;
Wang, L.
;
Sorgenfrei, S.
;
Watanabe, K.
;
Taniguchi, T.
;
Kim, P.
;
Shepard, K. L.
;
Hone, J.
.
NATURE NANOTECHNOLOGY,
2010, 5 (10)
:722-726

Dean, C. R.
论文数: 0 引用数: 0
h-index: 0
机构:
Columbia Univ, Dept Elect Engn, New York, NY 10027 USA
Columbia Univ, Dept Mech Engn, New York, NY 10027 USA Columbia Univ, Dept Elect Engn, New York, NY 10027 USA

Young, A. F.
论文数: 0 引用数: 0
h-index: 0
机构:
Columbia Univ, Dept Phys, New York, NY 10027 USA Columbia Univ, Dept Elect Engn, New York, NY 10027 USA

Meric, I.
论文数: 0 引用数: 0
h-index: 0
机构:
Columbia Univ, Dept Elect Engn, New York, NY 10027 USA Columbia Univ, Dept Elect Engn, New York, NY 10027 USA

Lee, C.
论文数: 0 引用数: 0
h-index: 0
机构:
Sungkyunkwan Univ, SKUU Adv Inst Nanotechnol SAINT, Suwon 440746, South Korea
Sungkyunkwan Univ, Dept Mech Engn, Suwon 440746, South Korea Columbia Univ, Dept Elect Engn, New York, NY 10027 USA

Wang, L.
论文数: 0 引用数: 0
h-index: 0
机构:
Columbia Univ, Dept Mech Engn, New York, NY 10027 USA Columbia Univ, Dept Elect Engn, New York, NY 10027 USA

Sorgenfrei, S.
论文数: 0 引用数: 0
h-index: 0
机构:
Columbia Univ, Dept Elect Engn, New York, NY 10027 USA Columbia Univ, Dept Elect Engn, New York, NY 10027 USA

Watanabe, K.
论文数: 0 引用数: 0
h-index: 0
机构:
Natl Inst Mat Sci, Adv Mat Lab, Tsukuba, Ibaraki 3050044, Japan Columbia Univ, Dept Elect Engn, New York, NY 10027 USA

Taniguchi, T.
论文数: 0 引用数: 0
h-index: 0
机构:
Natl Inst Mat Sci, Adv Mat Lab, Tsukuba, Ibaraki 3050044, Japan Columbia Univ, Dept Elect Engn, New York, NY 10027 USA

Kim, P.
论文数: 0 引用数: 0
h-index: 0
机构:
Columbia Univ, Dept Phys, New York, NY 10027 USA Columbia Univ, Dept Elect Engn, New York, NY 10027 USA

Shepard, K. L.
论文数: 0 引用数: 0
h-index: 0
机构:
Columbia Univ, Dept Elect Engn, New York, NY 10027 USA Columbia Univ, Dept Elect Engn, New York, NY 10027 USA

Hone, J.
论文数: 0 引用数: 0
h-index: 0
机构:
Columbia Univ, Dept Mech Engn, New York, NY 10027 USA Columbia Univ, Dept Elect Engn, New York, NY 10027 USA
[9]
Raman study on defective graphene: Effect of the excitation energy, type, and amount of defects
[J].
Eckmann, Axel
;
Felten, Alexandre
;
Verzhbitskiy, Ivan
;
Davey, Rebecca
;
Casiraghi, Cinzia
.
PHYSICAL REVIEW B,
2013, 88 (03)

Eckmann, Axel
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Manchester, Sch Chem, Manchester M13 9PL, Lancs, England Univ Manchester, Sch Chem, Manchester M13 9PL, Lancs, England

Felten, Alexandre
论文数: 0 引用数: 0
h-index: 0
机构:
Free Univ Berlin, Dept Phys, D-14195 Berlin, Germany Univ Manchester, Sch Chem, Manchester M13 9PL, Lancs, England

Verzhbitskiy, Ivan
论文数: 0 引用数: 0
h-index: 0
机构:
Free Univ Berlin, Dept Phys, D-14195 Berlin, Germany Univ Manchester, Sch Chem, Manchester M13 9PL, Lancs, England

Davey, Rebecca
论文数: 0 引用数: 0
h-index: 0
机构:
Free Univ Berlin, Dept Phys, D-14195 Berlin, Germany Univ Manchester, Sch Chem, Manchester M13 9PL, Lancs, England

Casiraghi, Cinzia
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Manchester, Sch Chem, Manchester M13 9PL, Lancs, England
Free Univ Berlin, Dept Phys, D-14195 Berlin, Germany Univ Manchester, Sch Chem, Manchester M13 9PL, Lancs, England
[10]
Probing the Nature of Defects in Graphene by Raman Spectroscopy
[J].
Eckmann, Axel
;
Felten, Alexandre
;
Mishchenko, Artem
;
Britnell, Liam
;
Krupke, Ralph
;
Novoselov, Kostya S.
;
Casiraghi, Cinzia
.
NANO LETTERS,
2012, 12 (08)
:3925-3930

Eckmann, Axel
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Manchester, Sch Chem, Manchester M13 9PL, Lancs, England
Univ Manchester, Photon Sci Inst, Manchester M13 9PL, Lancs, England Univ Manchester, Sch Chem, Manchester M13 9PL, Lancs, England

Felten, Alexandre
论文数: 0 引用数: 0
h-index: 0
机构:
Free Univ Berlin, Dept Phys, Berlin, Germany
Karlsruhe Inst Technol, Karlsruhe, Germany Univ Manchester, Sch Chem, Manchester M13 9PL, Lancs, England

Mishchenko, Artem
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Manchester, Sch Phys & Astron, Manchester M13 9PL, Lancs, England Univ Manchester, Sch Chem, Manchester M13 9PL, Lancs, England

Britnell, Liam
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Manchester, Sch Phys & Astron, Manchester M13 9PL, Lancs, England Univ Manchester, Sch Chem, Manchester M13 9PL, Lancs, England

Krupke, Ralph
论文数: 0 引用数: 0
h-index: 0
机构:
Karlsruhe Inst Technol, Karlsruhe, Germany Univ Manchester, Sch Chem, Manchester M13 9PL, Lancs, England

Novoselov, Kostya S.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Manchester, Sch Phys & Astron, Manchester M13 9PL, Lancs, England Univ Manchester, Sch Chem, Manchester M13 9PL, Lancs, England

Casiraghi, Cinzia
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Manchester, Sch Chem, Manchester M13 9PL, Lancs, England
Univ Manchester, Photon Sci Inst, Manchester M13 9PL, Lancs, England
Free Univ Berlin, Dept Phys, Berlin, Germany Univ Manchester, Sch Chem, Manchester M13 9PL, Lancs, England