Growth and characterization of nonpolar (10-10) ZnO transparent conductive oxide on semipolar (11-22) GaN-based light-emitting diodes

被引:35
作者
Kim, Ki-Wook [1 ]
Choi, Nak-Jung [1 ]
Kim, Kyoung-Bo [2 ]
Kim, Moojin [3 ]
Lee, Sung-Nam [1 ]
机构
[1] Korea Polytech Univ, Dept Nanoopt Engn, Shihung 429839, Gyeonggi Do, South Korea
[2] Inha Tech Coll, Dept Met & Mat Engn, Inchon 402752, South Korea
[3] Jungwon Univ, Dept Renewable Energy, 85 Munmu Ro, Goesan Gun 367805, Chungbuk, South Korea
基金
新加坡国家研究基金会;
关键词
GaN; ZnO; XRD; LED; TCO; ATOMIC LAYER DEPOSITION; THIN-FILMS; OHMIC CONTACTS; PLANE SAPPHIRE; ELECTROLUMINESCENCE; NANOSTRUCTURES; TEMPERATURE;
D O I
10.1016/j.jallcom.2016.01.073
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
We have grown thin films of nonpolar m-plane (10-10) ZnO on a semipolar (11-22) GaN template by atomic layer deposition (ALD) at low growth temperatures (<200 degrees C). The surface morphology of the ZnO film is found to be an arrowhead-like structure, which is a typical surface structure of the semipolar (11 -22) GaN films. On increasing the growth temperature of the ZnO films, the concentration and mobility of the charge carriers in the ZnO film are increased. However, the optical transmittance decreases with an increase in the growth temperature. Based on these results, we have fabricated semipolar (11-22) GaN-based light-emitting diodes (LEDs) with nonpolar m-plane ZnO film as a transparent conductive oxide (TCO) to improve the light extraction efficiency. In spite of a decrease in the optical transmittance, the operation voltage of semipolar (11-22) GaN-based LEDs is found to decrease with an increase in the growth temperature, which might be due to the improvements in the electrical properties and current spreading effect, resulting in an increase in the optical output power. (C) 2016 Elsevier B.V. All rights reserved.
引用
收藏
页码:88 / 92
页数:5
相关论文
共 27 条
[1]   Characterization of planar semipolar gallium nitride films on sapphire substrates [J].
Baker, TJ ;
Haskell, BA ;
Wu, F ;
Speck, JS ;
Nakamura, S .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 2006, 45 (4-7) :L154-L157
[2]   Nonpolar InGaN/GaN emitters on reduced-defect lateral epitaxially overgrown a-plane GaN with drive-current-independent electroluminescence emission peak [J].
Chakraborty, A ;
Haskell, BA ;
Keller, S ;
Speck, JS ;
DenBaars, SP ;
Nakamura, S ;
Mishra, UK .
APPLIED PHYSICS LETTERS, 2004, 85 (22) :5143-5145
[3]   Interface structure and anisotropic strain relaxation of nonpolar wurtzite (11(2)over-bar0) and (10(1)over-bar0) orientations: ZnO epilayers grown on sapphire [J].
Chauveau, J. -M. ;
Vennegues, P. ;
Lauegt, M. ;
Deparis, C. ;
Zuniga-Perez, J. ;
Morhain, C. .
JOURNAL OF APPLIED PHYSICS, 2008, 104 (07)
[4]   Epitaxial growth of Sb-doped nonpolar a-plane ZnO thin films on r-plane sapphire substrates by RF magnetron sputtering [J].
Chen, Hou-Guang ;
Hung, Sung-Po .
JOURNAL OF ALLOYS AND COMPOUNDS, 2014, 586 :S339-S342
[5]   Effective band gap inhomogeneity and piezoelectric field in InGaN/GaN multiquantum well structures [J].
Chichibu, SF ;
Abare, AC ;
Minsky, MS ;
Keller, S ;
Fleischer, SB ;
Bowers, JE ;
Hu, E ;
Mishra, UK ;
Coldren, LA ;
DenBaars, SP ;
Sota, T .
APPLIED PHYSICS LETTERS, 1998, 73 (14) :2006-2008
[6]   Polarization anisotropy in the electroluminescence of m-plane InGaN-GaN multiple-quantum-well light-emitting diodes [J].
Gardner, NF ;
Kim, JC ;
Wierer, JJ ;
Shen, YC ;
Krames, MR .
APPLIED PHYSICS LETTERS, 2005, 86 (11) :1-3
[7]   Defect reduction in (1(1)over-bar00) m-plane gallium nitride via lateral epitaxial overgrowth by hydride vapor phase epitaxy -: art. no. 111917 [J].
Haskell, BA ;
Baker, TJ ;
McLaurin, MB ;
Wu, F ;
Fini, PT ;
DenBaars, SP ;
Speck, JS ;
Nakamura, S .
APPLIED PHYSICS LETTERS, 2005, 86 (11) :1-3
[8]   Effect of the multiarray chip structure on the optical performance of GaN-based light emitting diodes [J].
Jeong, Gyu-Jae ;
Yoo, Ho-Dol ;
Kim, Kyoung-Kook ;
Lee, Sung-Nam .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2015, 33 (05)
[9]   Variation of light emitting properties of ZnO thin films depending on post-annealing temperature [J].
Kang, HS ;
Kang, JS ;
Pang, SS ;
Shim, ES ;
Lee, SY .
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 2003, 102 (1-3) :313-316
[10]   Growth and characterization of polar and nonpolar ZnO film grown on sapphire substrates by using atomic layer deposition [J].
Kim, Ki-Wook ;
Son, Hyo-Soo ;
Choi, Nak-Jung ;
Kim, Jihoon ;
Lee, Sung-Nam .
THIN SOLID FILMS, 2013, 546 :114-117