Temperature Dependencies of Electrical Properties of Thin Films Based on Solid Solutions PbSnAgTe

被引：0
作者：
Dzumedzey, R. O. [1 ]
Saliy, Ya P. [1 ]
Horichok, I., V [1 ]
机构：
[1] Vasyl Stefanyk Precarpathian Natl Univ, Ivano Frankivsk, Ukraine
来源：
PHYSICS AND CHEMISTRY OF SOLID STATE | 2020年 / 21卷 / 04期
关键词：
lead telluride; solid solution; electrical property; thin films; LATT; THERMOELECTRIC PROPERTIES; SB;
D O I：
10.15330/pcss.21.4.640-644
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
The electrical properties of thin polycrystalline films of solid solutions Pb18Ag2Te20, Pb16Sn2Ag2Te20 and Pb14Sn4Ag2Te20 ( LATT) on mica-muscovite substrates have been investigated. The temperature dependencies of concentration and mobility of charge carriers for these condensates are researched. Predominant scattering mechanisms are established. These are scattering on ionized impurities and acoustic phonons at low and high temperatures respectively.
引用
收藏
页码：640 / 644
页数：5
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