Single-photon imaging in complementary metal oxide semiconductor processes

被引:109
作者
Charbon, E. [1 ]
机构
[1] Delft Univ Technol, Dept Microelect, NL-2628 CD Delft, Netherlands
来源
PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES | 2014年 / 372卷 / 2012期
关键词
single-photon avalanche diode; avalanche photodiode; complementary metal oxide semiconductor; AVALANCHE-DIODE ARRAY; CMOS; DETECTOR; TIME; SENSOR; RESOLUTION; DESIGN; IMAGER;
D O I
10.1098/rsta.2013.0100
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
This paper describes the basics of single-photon counting in complementary metal oxide semiconductors, through single-photon avalanche diodes (SPADs), and the making of miniaturized pixels with photon-counting capability based on SPADs. Some applications, whichmay take advantage of SPAD image sensors, are outlined, such as fluorescence-based microscopy, three-dimensional time-of-flight imaging and biomedical imaging, to name just a few. The paper focuses on architectures that are best suited to those applications and the trade-offs they generate. In this context, architectures are described that efficiently collect the output of single pixels when designed in large arrays. Off-chip readout circuit requirements are described for a variety of applications in physics, medicine and the life sciences. Owing to the dynamic nature of SPADs, designs featuring a large number of SPADs require careful analysis of the target application for an optimal use of silicon real estate and of limited readout bandwidth. The paper also describes the main trade-offs involved in architecting such chips and the solutions adopted with focus on scalability and miniaturization.
引用
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页数:31
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