Plasma-surface interactions

被引:2
作者
Goeckner, M. J. [1 ]
Nelson, C. T. [1 ]
Sant, S. P. [1 ]
Jindal, A. K. [1 ]
Joseph, E. A. [1 ]
Zhou, B. S. [1 ]
Padron-Wells, G. [1 ]
Jarvis, B. [1 ]
Pierce, R. [1 ]
Overzet, L. J. [1 ]
机构
[1] Univ Texas Dallas, Dept Elect Engn, Richardson, TX 75083 USA
来源
24TH SUMMER SCHOOL AND INTERNATIONAL SYMPOSIUM ON THE PHYSICS OF IONIZED GASES | 2008年 / 133卷
关键词
D O I
10.1088/1742-6596/133/1/012010
中图分类号
O64 [物理化学(理论化学)、化学物理学]; O56 [分子物理学、原子物理学];
学科分类号
070203 ; 070304 ; 081704 ; 1406 ;
摘要
Materials processing is at a crossroads. Currently a large fraction of industrially viable materials processing is via plasmas. Until recently it has been economical to just examine the influence the plasma properties on the desired surface processes and through this ultimately optimize manufacturing. For example, it is well known that the surface processes (etch or deposition), occur in the top few mono-layers of the surface. Thus, in film growth one requires that molecules from the gas-phase land and bond on the surface. However as processing has reached the nano-scale, development of viable processes has become more and more difficult. In part, this is because of all of the free parameters that exist in plasmas. To overcome this economic issue, tool vendors and semiconductor companies have turned to complex computational models of processing plasmas. For those models to work, one requires a through understanding of all of the gas-phase and surface-phase processes that are exhibited in plasmas. Unfortunately, these processes, particularly those at the surface, are not well understood. In this article we describe a viable model of the surface-phase based on cross sections for processes that occur. While originally developed of fluorocarbon systems, the model also appears to be applicable to hydrocarbon systems.
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页数:10
相关论文
共 55 条
[1]   Molecular dynamics simulations of Si etching by energetic CF3+ [J].
Abrams, CF ;
Graves, DB .
JOURNAL OF APPLIED PHYSICS, 1999, 86 (11) :5938-5948
[2]   Measurement of absolute radical densities in a plasma using modulated-beam line-of-sight threshold ionization mass spectrometry [J].
Agarwal, S ;
Quax, GWW ;
van de Sanden, MCM ;
Maroudas, D ;
Aydil, ES .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2004, 22 (01) :71-81
[3]  
Chapman B., 1980, Glow Discharge Processes, sputtering and plasma etching, DOI DOI 10.1063/1.2914660
[4]   MECHANISMS IN PLASMA ETCHING [J].
COBURN, JW ;
WINTERS, HF .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1978, 15 (02) :327-328
[5]   Studies of the low-pressure inductively-coupled plasma etching for a larger area wafer using plasma modeling and Langmuir probe [J].
Collison, WZ ;
Ni, TQ ;
Barnes, MS .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1998, 16 (01) :100-107
[6]   Energy distribution of ions bombarding biased electrodes in high density plasma reactors [J].
Edelberg, EA ;
Perry, A ;
Benjamin, N ;
Aydil, ES .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1999, 17 (02) :506-516
[7]   COMPUTER-SIMULATION OF A CF4 PLASMA-ETCHING SILICON [J].
EDELSON, D ;
FLAMM, DL .
JOURNAL OF APPLIED PHYSICS, 1984, 56 (05) :1522-1531
[8]  
FLAMM D, 1986, PLASMA ETCHING INTRO
[9]   Modified gaseous electronics conference reference cell for the study of plasma-surface-gas interactions [J].
Goeckner, MJ ;
Marquis, JM ;
Markham, BJ ;
Jindal, AK ;
Joseph, EA ;
Zhou, BS .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2004, 75 (04) :884-890
[10]   Fluorine atom subsurface diffusion and reaction in photoresist [J].
Greer, F ;
Fraser, D ;
Coburn, JW ;
Graves, DB .
JOURNAL OF APPLIED PHYSICS, 2003, 94 (12) :7453-7461