Spectroscopic Estimation of Surface Roughness Depth for mm-Wave Radar Sensors

被引：0

作者：

Scharf, Philipp A. ^{[1
]}

Mutschler, Marc A. ^{[1
]}

Iberle, Johannes ^{[1
]}

Mantz, Hubert ^{[1
]}

Walter, Thomas ^{[1
]}

Waldschmidt, Christian ^{[2
]}

机构：

[1] Ulm Univ Appl Sci, Lab Microtechnol, Ulm, Germany

[2] Ulm Univ, Inst Microwave Engn, Ulm, Germany

来源：

2019 16TH EUROPEAN RADAR CONFERENCE (EURAD) | 2019年

关键词：

Millimeter wave propagation; scattering parameters; radar measurements; environmental monitoring; automotive applications;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This contribution presents a spectroscopic approach for the classification of randomly rough surfaces. With the Kirchhoff-Fraunhofer diffraction theory as a basis, statistically complex interference patterns of arbitrary surfaces are simulated to derive a model for the suggested roughness depth estimation algorithm. The applicability of this method in terms of achievable accuracy and measuring range is evaluated by measurements on reference surfaces.

引用

页码：93 / 96

页数：4

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