Compact modelling and analysis of power-sharing unbalances in IGBT-modules used in traction applications

被引：24

作者：

Castellazzi, A. ^{[1
]}

Ciappa, M. ^{[1
]}

Fichtner, W. ^{[1
]}

Lourdel, G. ^{[1
]}

Mermet-Guyennet, M. ^{[1
]}

机构：

[1] Swiss Fed Inst Technol, Integrated Syst Lab, Zurich, Switzerland

来源：

MICROELECTRONICS RELIABILITY | 2006年 / 46卷 / 9-11期

关键词：

D O I：

10.1016/j.microrel.2006.07.055

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

IGBT modules are critical components for the reliability of power converters used in traction applications. A thorough analysis of all stressful operating conditions is a complex task, which requires versatile simulation capability. In this paper a comprehensive electro-thermal model of an IGBT-module is developed. Then, circuit simulation is used to investigate the power sharing between parallel chips during transient operation. Unbalances are observed, their causes identified and their influence on device degradation pointed out and discussed.

引用

页码：1754 / 1759

页数：6

共 9 条

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