Nonlinear space charge dynamics in mixed ionic-electronic conductors: Resistive switching and ferroelectric-like hysteresis of electromechanical response

被引:26
作者
Morozovska, Anna N. [1 ]
Eliseev, Eugene A. [2 ]
Varenyk, Olexandr V. [3 ]
Kim, Yunseok [4 ,5 ]
Strelcov, Evgheni [5 ]
Tselev, Alexander [5 ]
Morozovsky, Nicholas V. [1 ]
Kalinin, Sergei V. [5 ]
机构
[1] NAS Ukraine, Inst Phys, UA-03028 Kiev, Ukraine
[2] NAS Ukraine, Inst Problems Mat Sci, UA-03028 Kiev, Ukraine
[3] Taras Shevchenko Kyiv Natl Univ, Radiophys Fac 4, UA-03022 Kiev, Ukraine
[4] Sungkyunkwan Univ, Sch Adv Mat Sci & Engn, Suwon 440746, South Korea
[5] Oak Ridge Natl Lab, Ctr Nanophase Mat Sci, Oak Ridge, TN 37831 USA
基金
美国国家科学基金会;
关键词
INTERCALATION-INDUCED STRESS; PHASE-TRANSITION PATHWAYS; TRANSPORT; EVOLUTION; PARTICLE; DEVICES; MOTION; MODEL;
D O I
10.1063/1.4891346
中图分类号
O59 [应用物理学];
学科分类号
摘要
We performed self-consistent modelling of nonlinear electrotransport and electromechanical response of thin films of mixed ionic-electronic conductors (MIEC) allowing for steric effects of mobile charged defects (ions, protons, or vacancies), electron degeneration, and Vegard stresses. We establish correlations between the features of the nonlinear space-charge dynamics, current-voltage, and bending-voltage curves for different types of the film electrodes. A pronounced ferroelectric-like hysteresis of the bending-voltage loops and current maxima on the double hysteresis current-voltage loops appear for the electron-transport electrodes. The double hysteresis loop with pronounced humps indicates a memristor-type resistive switching. The switching occurs due to the strong nonlinear coupling between the electronic and ionic subsystems. A sharp meta-stable maximum of the electron density appears near one open electrode and moves to another one during the periodic change of applied voltage. Our results can explain the nonlinear nature and correlation of electrical and mechanical memory effects in thin MIEC films. The analytical expression proving that the electrically induced bending of MIEC films can be detected by interferometric methods is derived. (C) 2014 AIP Publishing LLC.
引用
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页数:11
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