Ink-jet printed BNT thin films with improved ferroelectric properties via annealing in wet air

被引:7
作者
Cheng, Zhi [1 ]
Zhao, Zhe [1 ,2 ]
机构
[1] Tianjin Univ, Sch Mat Sci & Engn, Minist Educ, Key Lab Adv Ceram & Machining Technol, Tianjin 300072, Peoples R China
[2] KTH Royal Inst Technol, Dept Mat Sci & Engn, SE-10044 Stockholm, Sweden
关键词
Ink-jet printing; Bismuth sodium titanate; Ferroelectric thin films; Oxygen vacancies; PULSED-LASER DEPOSITION; REDUCED LEAKAGE CURRENT; DOPED BIFEO3; CONDUCTION;
D O I
10.1016/j.ceramint.2018.03.104
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
In this work, an ink-jet printing process based on the sol-gel route was applied to prepare lead-free ferroelectric Na(0.5)Bio(0.5)TiO(3)(BNT) thin films for the first time. Dense and crack -free films with perovskite structure were obtained from a modified precursor solution through multiple printing and pyrolysis processes. The ferroelectric, dielectric and electrical properties were significantly affected by the annealing temperature and atmosphere. The film annealed at 670 degrees C in wet air showed a high remnant polarization of 24.7 mu C/cm(2) with a low coercive field of 263 kV/cm, the dielectric constant and loss were 185 and 0.1 at 10 kHz, respectively. It was found that wet air was an alternative to reduce oxygen vacancies and enhance properties of ferroelectric films, which can be explained by the defect chemical reaction between water and oxygen vacancies. X-ray photoelectron spectroscopy(XPS) confirmed the decrease of oxygen vacancies after annealing with water presence, with a formation of Ohmic conduction mechanism dominated by charged hydroxyl groups.
引用
收藏
页码:10700 / 10707
页数:8
相关论文
共 25 条
  • [1] Effect of oxygen vacancy and Mn-doping on electrical properties of Bi4Ti3O12 thin film grown by pulsed laser deposition
    Choi, Joo-Young
    Choi, Chang-Hak
    Cho, Kyung-Hoon
    Seong, Tae-Geun
    Nahm, Sahn
    Kang, Chong-Yun
    Yoon, Seok-Jin
    Kim, Jong-Hee
    [J]. ACTA MATERIALIA, 2009, 57 (08) : 2454 - 2460
  • [2] Lead-free Na0.5Bi0.5TiO3 ferroelectric thin films grown by Pulsed Laser Deposition on epitaxial platinum bottom electrodes
    Duclere, J. -R.
    Cibert, C.
    Boulle, A.
    Dorcet, V.
    Marchet, P.
    Champeaux, C.
    Catherinot, A.
    Deputier, S.
    Guilloux-Viry, M.
    [J]. THIN SOLID FILMS, 2008, 517 (02) : 592 - 597
  • [3] Progress in the developments of (Ba,Sr)TiO3 (BST) thin films for Gigabit era DRAMs
    Ezhilvalavan, S
    Tseng, TY
    [J]. MATERIALS CHEMISTRY AND PHYSICS, 2000, 65 (03) : 227 - 248
  • [4] Origin of dielectric relaxation observed for Ba0.5Sr0.5TiO3 thin-film capacitor
    Fukuda, Y
    Numata, K
    Aoki, K
    Nishimura, A
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1996, 35 (9B): : 5178 - 5180
  • [5] Microstructure, leakage current and dielectric tunability of Na0.5Bi0.5(Ti0.99Zn0.01)O3 thin films: An annealing atmosphere-dependent study
    Geng, F. J.
    Yang, C. H.
    Lv, P. P.
    Wei, C.
    Qian, J.
    Feng, C.
    Jiang, X. M.
    Song, P.
    [J]. CERAMICS INTERNATIONAL, 2016, 42 (07) : 8744 - 8749
  • [6] Electrical behaviors of c-axis textured 0.975Bi0.5Na0.5TiO3-0.025BiCoO3 thin films grown by pulsed laser deposition
    Guo, Feifei
    Yang, Bin
    Zhang, Shantao
    Liu, Danqing
    Wu, Fengmin
    Wang, Dali
    Cao, Wenwu
    [J]. APPLIED SURFACE SCIENCE, 2013, 283 : 759 - 763
  • [7] Decoding the Fingerprint of Ferroelectric Loops: Comprehension of the Material Properties and Structures
    Jin, Li
    Li, Fei
    Zhang, Shujun
    [J]. JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 2014, 97 (01) : 1 - 27
  • [8] Oxygen-vacancy-related relaxation and scaling behaviors of Bi0.9La0.1Fe0.98Mg0.02O3 ferroelectric thin films
    Ke, Qingqing
    Lou, Xiaojie
    Wang, Yang
    Wang, John
    [J]. PHYSICAL REVIEW B, 2010, 82 (02)
  • [9] Proton-conducting oxides
    Kreuer, KD
    [J]. ANNUAL REVIEW OF MATERIALS RESEARCH, 2003, 33 : 333 - 359
  • [10] Structural, dielectric and piezoelectric properties of (Bi0.5Na0.5)TiO3-(Bi0.5K0.5)TiO3-Bi(Zn0.5Ti0.5)O3 thin films prepared by sol-gel method
    Li, Wei
    Zeng, Huarong
    Zhao, Kunyu
    Hao, Jigong
    Zhai, Jiwei
    [J]. CERAMICS INTERNATIONAL, 2014, 40 (06) : 7947 - 7951