Glass micromachining using the VUVF2 laser

被引:8
|
作者
Dyer, PE [1 ]
Maswadi, SM [1 ]
Snelling, HV [1 ]
Walton, CD [1 ]
机构
[1] Univ Hull, Dept Phys, Kingston Upon Hull HU6 7RX, N Humberside, England
来源
PHOTON PROCESSING IN MICROELECTRONICS AND PHOTONICS | 2002年 / 4637卷
关键词
VUV; F-2; laser; micromachining; glass; ablation; surface roughness;
D O I
10.1117/12.470626
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Theoretical and experimental studies of the surface quality in 157nm F-2 laser-ablated glasses are reported. Limitations set by statistical fluctuations in the multi-mode beam and by stationary beam non-uniformity are explored together with materials issues such as laser- induced surface cracking. Experimental work on ablating polymethylmethacrylate (PMMA), used as a low threshold medium for recording of the VUV beam, and soda lime glass are described. Use is made of the probe beam deflection technique to determine ablation thresholds, and a variety of methods adopted for characterising and assessing the quality of ablated surfaces e.g. scanning-electron microscopy, mechanical and optical interference profiling and atomic force microscopy. Preliminary roughness measurements are compared with theoretical expectations and the implication for glass micromachining with the F-2 laser discussed.
引用
收藏
页码:218 / 227
页数:10
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