Optical and electrical characterization at the nanoscale with a transparent probe of a scanning tunnelling microscope

被引：4

作者：

Sychugov, Ilya ^{[1
]}

Omi, Hiroo ^{[1
]}

Murashita, Tooru ^{[1
]}

Kobayashi, Yoshihiro ^{[1
]}

机构：

[1] NTT Corp, NTT Basic Res Labs, Kanagawa 2430198, Japan

来源：

NANOTECHNOLOGY | 2009年 / 20卷 / 14期

关键词：

D O I：

10.1088/0957-4484/20/14/145706

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

A new type of scanning probe microscope, combining features of the scanning tunnelling microscope, the scanning tunnelling luminescence microscope with a transparent probe and the aperture scanning near-field optical microscope, is described. Proof-of-concept experiments were performed under ultrahigh vacuum conditions at varying temperature on GaAs/AlAs heterostructures.

引用

页数：4

共 12 条

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