Near-field Raman spectra of ferroelectric single crystals

被引:2
作者
Sakai, A [1 ]
Ninomiya, T [1 ]
Sasaki, N [1 ]
机构
[1] Muroran Inst Technol, Dept Elect & Elect Engn, Muroran, Hokkaido 0508585, Japan
关键词
near-field; scanning microscopy; Raman scattering; internal modes; nano-scale;
D O I
10.1080/00150190490454198
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Raman scattering spectra of ferroelectric single crystals has been observed with high spatial resolution using a near-field optical microscope. A Si cantilever with aperture of about 150 nm in diameter was used both as an illumination nano-source and a nano-detector of scattering light. The near-field Raman spectrum obtained by the subtraction of the background is in agreement with that of the micro-Raman scattering. Near the lattice defect in GMO, the sample was scanned in nano-scale and near-field Raman spectra were observed as a function of position on the surface.
引用
收藏
页码:227 / 232
页数:6
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