Thickness-dependent structural transitions in fluorinated copper-phthalocyanine (F16CuPc) films

被引：102

作者：

de Oteyza, Dimas G.

Barrena, Esther

Osso, J. Oriol

Sellner, Stefan

Dosch, Helmut

机构：

[1] Max Planck Inst Met Res, D-70569 Stuttgart, Germany

[2] Univ Stuttgart, Inst Theoret & Angew Phys, D-70550 Stuttgart, Germany

[3] Inst Ciencia Mat Barcelona, CSIC, Bellaterra 08193, Spain

来源：

JOURNAL OF THE AMERICAN CHEMICAL SOCIETY | 2006年 / 128卷 / 47期

关键词：

D O I：

10.1021/ja064641r

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

The detailed structure of F16CuPc films on SiO2 has been determined by means of in situ grazing incidence X-ray diffraction from the first monolayer to thicker films. In contrast to films of the homologous H16CuPc molecule, the F16CuPc films exhibit the same structure independently from the deposition temperature. The films show a thickness-dependent polymorphism manifested in the in-plane crystal structure, which implies large differences in the molecular tilt within the cofacial stacking of the molecules. Copyright © 2006 American Chemical Society.

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页码：15052 / 15053

页数：2

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