Subsurface damage assessment with atomic force microscopy

被引：0
|
作者：
Carr, JW [1 ]
Fearon, E [1 ]
Summers, LJ [1 ]
Hutcheon, ID [1 ]
机构：
[1] Lawrence Livermore Natl Lab, Livermore, CA 94551 USA
来源：
PRECISION ENGINEERING, NANOTECHNOLOGY, VOL. 2 | 1999年
关键词：
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：451 / 454
页数：4
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