The optical properties of Bi3.25La0.75Ti3O12 thin films with different thickness prepared by chemical solution deposition

被引：13

作者：

Hu, SH ^{[1
]}

Chen, J ^{[1
]}

Hu, ZG ^{[1
]}

Wang, GS ^{[1
]}

Meng, XJ ^{[1
]}

Chu, JH ^{[1
]}

Dai, N ^{[1
]}

机构：

[1] Chinese Acad Sci, Natl Lab Infrared Phys, Shanghai Inst Tech Phys, Shanghai 200083, Peoples R China

来源：

MATERIALS RESEARCH BULLETIN | 2004年 / 39卷 / 09期

关键词：

thin films; sol-gel chemistry; optical properties;

D O I：

10.1016/j.materresbull.2004.04.030

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Bi3.25La0.75Ti3O12(BiLT) thin films with different thickness were successfully deposited onto fused quartz by chemical solution deposition. X-ray diffraction analysis shows that BiLT thin films are polycrystalline with (0 0 2)-preferred orientation. The dispersion of refractive indices of the BiLT thin films was investigated by the optical transmittance spectrum. The optical band gap energy was estimated from the graph of (hvalpha)(2) versus hv. The results show that the refractive index and band-gap energy of the BiLT thin films decrease with the films thickness. (C) 2004 Elsevier Ltd. All rights reserved.

引用

页码：1223 / 1229

页数：7

共 17 条

[1]

Bao DH, 1998, PHYS STATUS SOLIDI A, V169, P227, DOI 10.1002/(SICI)1521-396X(199810)169:2<227::AID-PSSA227>3.0.CO

[2]

2-R

[3] Fatigue-free behavior of highly oriented Bi3.25La0.75Ti3O12 thin films grown on Pt/Ti/SiO2/Si(100) by metalorganic solution decomposition [J].