The Influence of Uncertainty Contributions on Deep Learning Architectures in Vision-Based Evaluation Systems

被引:11
作者
Callari, Giuseppina [1 ]
Mencattini, Arianna [1 ]
Casti, Paola [1 ]
Comes, Maria Colomba [1 ]
Di Giuseppe, Davide [1 ]
Di Natale, Corrado [1 ]
Sammarco, Innocenzo [3 ]
Pietroiusti, Antonio [3 ]
Magrini, Andrea [3 ]
Lesci, Isidoro Giorgio [4 ]
Luce, Marco [2 ]
Cricenti, Antonio [2 ]
Martinelli, Eugenio [1 ]
机构
[1] Univ Roma Tor Vergata, Dept Elect Engn, Rome, Italy
[2] CNR, Ist Struttura Mat, Rome, Italy
[3] Univ Roma Tor Vergata, Dept Biomed & Prevent, Rome, Italy
[4] WAPH Technol Corp, Weston, FL 33326 USA
基金
欧盟地平线“2020”;
关键词
Atomic force microscopy (AFM); deep learning (DL); measurement uncertainty; vision-based evaluation (VBE) system; TRANSLOCATION; PARTICLES; EXPOSURE;
D O I
10.1109/TIM.2019.2906399
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Vision-based measurement (VBM) systems are powerful tool to extract quantitative information by acquiring video sequence or static images. When a VBM is applied to the evaluation of nominal properties, such as image characteristics, the term VBM is substituted with vision-based evaluation (VBE) by extending the framework of operation unit to a new concept of evaluation unit (EU) for the image analysis and machine learning phases. To this regard, deep learning (DL) approaches have gained an exponential interest in the research and industrial community, thanks to incredible flexibility toward visual words and the possibility to abandon subjective feature extraction procedures. From such an explosiveness of applications, it emerges the need to conduct studies on the capability of DL strategies to deal with uncertainty contributions, i.e., definitional uncertainty related to the measurand and reference uncertainty that may occur during the calibration process. In order to present a benchmark platform to analyze the effect of the major sources of uncertainties estimated, we use here an atomic force microscopy (AFM) imaging scenario for the evaluation of the effect of nanoparticles exposure on human cells in the laboratory. These studies are nowadays fundamental in toxicity analysis for monitoring the health conditions of workers and for protecting people from atherosclerosis disease. The performance of the proposed VBE-DL system to recognize cell alterations from the AFM images is related to three different sources of uncertainty and a critical analysis of the results achieved is provided.
引用
收藏
页码:2425 / 2432
页数:8
相关论文
共 26 条
[1]  
Adamcik J, 2010, NAT NANOTECHNOL, V5, P423, DOI [10.1038/NNANO.2010.59, 10.1038/nnano.2010.59]
[2]  
[Anonymous], 2008, 1012008 JCGM BIPM IF
[3]  
[Anonymous], 2018, P IEEE INT S MED MEA
[4]  
[Anonymous], 2009, 1042009 JCGM BIPM IE
[5]  
[Anonymous], 2012, 2002012 JCGM BIPM IE
[6]   Design of Multiple Modulated Frequency Lock-In Amplifier for Tapping-Mode Atomic Force Microscopy Systems [J].
Ayat, Mehdi ;
Karami, Mohammad Amin ;
Mirzakuchaki, Sattar ;
Beheshti-Shirazi, Aliasghar .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2016, 65 (10) :2284-2292
[7]   Face Based Recognition Algorithms: A First Step Toward a Metrological Characterization [J].
Betta, Giovanni ;
Capriglione, Domenico ;
Corvino, Mariella ;
Liguori, Consolatina ;
Paolillo, Alfredo .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2013, 62 (05) :1008-1016
[8]  
BISHOP C. M., 2006, Pattern recognition and machine learning, DOI [DOI 10.1117/1.2819119, 10.1007/978-0-387-45528-0]
[9]   Robust classification of biological samples in atomic force microscopy images via multiple filtering cooperation [J].
Casti, Paola ;
Mencattini, Arianna ;
Sammarco, Innocenzo ;
Velappa, Sowmya Jayaraman ;
Magna, Gabriele ;
Cricenti, Antonio ;
Luce, Marco ;
Pietroiusti, Antonio ;
Lesci, Giorgio Isidoro ;
Ferrucci, Luigi ;
Magrini, Andrea ;
Martinelli, Eugenio ;
Di Natale, Corrado .
KNOWLEDGE-BASED SYSTEMS, 2017, 133 :221-233
[10]  
Gonzales R.C., 2002, Digital Image Processing