High Temperature Characteristics of Coplanar Waveguide on R-Plane Sapphire and Alumina

被引：9
作者：
Ponchak, George E. [1 ]
Jordan, Jennifer L. [1 ]
Scardelletti, Maximilian C. [1 ]
机构：
[1] NASA, Glenn Res Ctr, Cleveland, OH 44135 USA
来源：
IEEE TRANSACTIONS ON ADVANCED PACKAGING | 2009年 / 32卷 / 01期
关键词：
Alumina; attenuation; coplanar waveguide; effective permittivity; high temperature; sapphire; MICROWAVE MEASUREMENT; PERMITTIVITY; PROBE;
D O I：
10.1109/TADVP.2008.2009123
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
This paper presents the characteristics of coplanar waveguide transmission lines on R-plane sapphire and alumina over the temperature range of 25 degrees C-400 degrees C and the frequency range of 45 MHz-50 GHz. A thru-reflect-line calibration technique and open circuited terminated stubs are used to extract the attenuation and effective permittivity. It is shown that the effective permittivity of the transmission lines and, therefore, the relative dielectric constant of the two substrates increase linearly with temperature. The attenuation of the coplanar waveguide varies linearly with temperature through 200 degrees C, and increases at a greater rate above 200 degrees C.
引用
收藏
页码：146 / 151
页数：6
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