Dielectric breakdown of an unpoled piezoelectric material with a conductive channel

被引:5
作者
Lin, S. [1 ]
Beom, H. G. [1 ]
Tao, D. [1 ]
Kim, Y. H. [1 ]
机构
[1] Inha Univ, Dept Engn Mech, Inchon 402751, South Korea
关键词
dielectric properties; failure analysis; PZT; strength; CRACKS; TIP;
D O I
10.1111/j.1460-2695.2009.01362.x
中图分类号
TH [机械、仪表工业];
学科分类号
0802 ;
摘要
The dielectric breakdown of an unpoled piezoelectric ceramic, PZT807, with a conductive channel, is investigated. Cylindrical bar specimens with a conductive channel are used for breakdown tests of the unpoled piezoelectric ceramic under purely electrical loads. Narrow tubular channels emanating from the head of the initial channel are observed in the specimens after breakdown occurs. The radius of the tubular channel that is created at the surface of the initial channel head is insensitive to various types of channel formation. The problem of a fine tubular channel that emanates from the initial channel head is numerically solved to evaluate the three-dimensional J integral, which is directly related to the energy that is available at breakdown, at the initiation of a new channel in the specimen. The critical J integral at the onset of breakdown is obtained.
引用
收藏
页码:580 / 586
页数:7
相关论文
共 10 条
[1]  
*ASTM INT, 2004, ASTMD375597
[2]   Application of J integral to breakdown analysis of a dielectric material [J].
Beom, H. G. ;
Kim, Y. H. .
INTERNATIONAL JOURNAL OF SOLIDS AND STRUCTURES, 2008, 45 (24) :6045-6055
[3]   Near-tip fields and intensity factors for interfacial cracks in dissimilar anisotropic piezoelectric media [J].
Beom, HG ;
Atluri, SN .
INTERNATIONAL JOURNAL OF FRACTURE, 1996, 75 (02) :163-183
[4]   Singular behaviour near a crack tip in an electrostrictive material [J].
Beom, HG .
JOURNAL OF THE MECHANICS AND PHYSICS OF SOLIDS, 1999, 47 (05) :1027-1049
[5]   LINEAR DIELECTRIC-BREAKDOWN ELECTROSTATICS [J].
GARBOCZI, EJ .
PHYSICAL REVIEW B, 1988, 38 (13) :9005-9010
[6]   The influence of mechanical stress on the dielectric breakdown field strength of thin SiO2 films [J].
Jeffery, S ;
Sofield, CJ ;
Pethica, JB .
APPLIED PHYSICS LETTERS, 1998, 73 (02) :172-174
[7]   CRACK EXTENSION FORCE IN A PIEZOELECTRIC MATERIAL [J].
PAK, YE .
JOURNAL OF APPLIED MECHANICS-TRANSACTIONS OF THE ASME, 1990, 57 (03) :647-653
[8]   A PATH INDEPENDENT INTEGRAL AND APPROXIMATE ANALYSIS OF STRAIN CONCENTRATION BY NOTCHES AND CRACKS [J].
RICE, JR .
JOURNAL OF APPLIED MECHANICS, 1968, 35 (02) :379-+
[9]   MODELS FOR BREAKDOWN-RESISTANT DIELECTRIC AND FERROELECTRIC CERAMICS [J].
SUO, Z .
JOURNAL OF THE MECHANICS AND PHYSICS OF SOLIDS, 1993, 41 (07) :1155-1176
[10]   ELECTROFRACTURE MECHANICS OF DIELECTRIC AGING [J].
ZELLER, HR ;
SCHNEIDER, WR .
JOURNAL OF APPLIED PHYSICS, 1984, 56 (02) :455-459