Spread spectrum phase modulation for coherent X-ray diffraction imaging

被引：9

作者：

Zhang, Xuesong ^{[1
,2
]}

Jiang, Jing ^{[3
]}

Bin Xiangli ^{[1
]}

Arce, Gonzalo R. ^{[4
]}

机构：

[1] Chinese Acad Sci, Acad Optoelect, Beijing 100094, Peoples R China

[2] CETC, Acad Electroopt, Electroopt Informat Secur Control Lab, Sanhe 065201, Peoples R China

[3] Beijing Union Univ, Coll Informat Technol, Beijing 100101, Peoples R China

[4] Univ Delaware, Dept Elect & Comp Engn, Newark, DE 19716 USA

来源：

OPTICS EXPRESS | 2015年 / 23卷 / 19期

关键词：

PTYCHOGRAPHY; MICROSCOPY; RESOLUTION; CRYSTALLOGRAPHY; RETRIEVAL;

D O I：

10.1364/OE.23.025034

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

High dynamic range, phase ambiguity and radiation limited resolution are three challenging issues in coherent X-ray diffraction imaging (CXDI), which limit the achievable imaging resolution. This paper proposes a spread spectrum phase modulation (SSPM) method to address the aforementioned problems in a single strobe. The requirements on phase modulator parameters are presented, and a practical implementation of SSPM is discussed via ray optics analysis. Numerical experiments demonstrate the performance of SSPM under the constraint of available X-ray optics fabrication accuracy, showing its potential to real CXDI applications. (C) 2015 Optical Society of America

引用

页码：25034 / 25047

页数：14

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