Optical characterization of Ag-Sb-Te chalcogenide thin films

被引：3
|
作者：
Sharma, YD
Bhatnagar, PK
机构：
[1] Osaka Univ, Grad Sch Engn, Dept Elect Engn, Suita, Osaka 5650871, Japan
[2] Univ Delhi, Dept Elect Sci, New Delhi 110021, India
来源：
OPTICAL ENGINEERING | 2006年 / 45卷 / 03期
关键词：
optical constants; reflectance; phase contrast; optical materials; thin films; transmittance;
D O I：
10.1117/1.2181586
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
A systematic investigation of AgxSb2(1-x)Te3(1-x) (x = 0.16, 0.18, and 0.20) is reported. The optical properties of the material were studied using a UV spectrophotometer. The optical behavior of a material is generally utilized to determine its optical constants such as reflectance, transmittance, and optical band gap E-0. The value of E-0 is estimated for these samples by measuring the absorption coefficient as a function of the wavelength of light in the range 300 to 1400 nm. Films of different Ag content were studied both before and after annealing. It was concluded that this material is a candidate for phase change optical memory. (c) 2006 Society of Photo-Optical Instrumentation Engineers.
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页数：7
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