Enhanced magnetoresistance in nanocrystalline La0.6Pb0.4MnO3 thin films

被引：9

作者：

Singh, A

Aswal, DK

Viswanadham, CS

Goswami, GL

Gupta, LC

Gupta, SK

Yakhmi, JV

机构：

[1] Govt India, Bhabha Atom Res Ctr, Tech Phys & Protype Engn Div, Mumbai 400085, India

[2] Bhabha Atom Res Ctr, Atom Fuels Div, Mumbai 400085, India

[3] Tata Inst Fundamental Res, Mumbai 400005, India

来源：

JOURNAL OF CRYSTAL GROWTH | 2002年 / 244卷 / 3-4期

关键词：

atomic force microscopy; X-ray diffraction; laser epitaxy; colossal magnetoresistive material; nanocrystalline films;

D O I：

10.1016/S0022-0248(02)01699-8

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

The nanocrystalline La0.6Pb0.4MnO3 thin films have been grown on (100) SrTiO3 substrates using pulsed-laser ablation technique. The atomic force microscopy and X-ray diffraction measurements show that the films consist of single-crystalline grains of an average size of similar to 17 nm with c-axis perpendicular to the substrate plane. These nanocrystalline films exhibit an enhanced magnetoresistance of > 100% at 1 T in the vicinity of the Curie temperature. Magnetization data suggest that grain boundaries act as tunnel barriers leading to an enhancement in the magnetoresistance. (C) 2002 Elsevier Science B.V. All rights reserved.

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收藏

页码：313 / 317

页数：5

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