Room-temperature electroluminescence from electron-hole plasmas in the metal-oxide-silicon tunneling diodes

被引:88
|
作者
Liu, CW [1 ]
Lee, MH [1 ]
Chen, MJ [1 ]
Lin, IC [1 ]
Lin, CF [1 ]
机构
[1] Natl Taiwan Univ, Dept Elect Engn, Taipei 10764, Taiwan
关键词
D O I
10.1063/1.126081
中图分类号
O59 [应用物理学];
学科分类号
摘要
An electron-hole plasma recombination model is used to fit the room-temperature electroluminescence from metal-oxide-silicon tunneling diodes. The relatively narrow line shape in the emission spectra can be understood by the quasi-Fermi level positions of electrons and holes, which both lie in the band gap. This model also gives a narrower band gap than that of bulk silicon. The surface band bending in the Si/oxide interface is responsible for this energy gap reduction. (C) 2000 American Institute of Physics. [S0003-6951(00)04512-5].
引用
收藏
页码:1516 / 1518
页数:3
相关论文
共 50 条
  • [1] Temperature dependence of the electron-hole-plasma electroluminescence from metal-oxide-silicon tunneling diodes
    Liu, CW
    Chen, MJ
    Lin, IC
    Lee, MH
    Lin, CF
    APPLIED PHYSICS LETTERS, 2000, 77 (08) : 1111 - 1113
  • [2] Room-temperature electroluminescence from metal-oxide-silicon-tunneling diodes on (110) substrates
    Liu, Chee-Wee
    Lee, Min-Hung
    Chang, Shu-Tong
    Chen, Miin-Jang
    Lin, Ching-Fuh
    2000, JJAP, Tokyo (39)
  • [3] Room-temperature electroluminescence from metal-oxide-silicon-tunneling diodes on (110) substrates
    Liu, CW
    Lee, MH
    Chang, ST
    Chen, MJ
    Lin, CF
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 2000, 39 (10B): : L1016 - L1018
  • [4] Enhanced reliability of electroluminescence from metal-oxide-silicon tunneling diodes by deuterium incorporation
    Liu, CW
    Lin, CH
    Lee, MH
    Chang, ST
    Liu, YH
    Chen, MJ
    Lin, CF
    APPLIED PHYSICS LETTERS, 2001, 78 (10) : 1397 - 1399
  • [5] Hot carrier recombination model of visible electroluminescence from metal-oxide-silicon tunneling diodes
    Liu, CW
    Chang, ST
    Liu, WT
    Chen, MJ
    Lin, CF
    APPLIED PHYSICS LETTERS, 2000, 77 (26) : 4347 - 4349
  • [6] Room-Temperature Macroscopic Coherence of Two Electron-Hole Plasmas in a Microcavity
    Jie, Qi
    Zhang, Keye
    Lai, Chih-Wei
    Hsu, Feng-Kuo
    Zhang, Weiping
    Luo, Song
    Lee, Yi-Shan
    Lin, Sheng-Di
    Chen, Zhanghai
    Xie, Wei
    PHYSICAL REVIEW LETTERS, 2020, 124 (15)
  • [7] Electroluminescence and photoluminescence studies on carrier radiative and nonradiative recombinations in metal-oxide-silicon tunneling diodes
    Chen, MJ
    Chang, JF
    Yen, JL
    Tsai, CS
    Liang, EZ
    Lin, CF
    Liu, CW
    JOURNAL OF APPLIED PHYSICS, 2003, 93 (07) : 4253 - 4259
  • [8] Enhancing electroluminescence from metal-oxide-silicon tunneling diodes by nano-structures of oxide grown by liquid-phase method
    Lin, CF
    Su, TW
    Chung, PF
    Liang, EZ
    Chen, MJ
    Liu, CW
    MATERIALS CHEMISTRY AND PHYSICS, 2003, 77 (02) : 430 - 433
  • [9] Carrier lifetime measurement on electroluminescent metal-oxide-silicon tunneling diodes
    Chen, MJ
    Lin, CF
    Lee, MH
    Chang, ST
    Liu, CW
    APPLIED PHYSICS LETTERS, 2001, 79 (14) : 2264 - 2266
  • [10] Roughness-enhanced electroluminescence from metal oxide silicon tunneling diodes
    Liu, CW
    Lee, MH
    Chen, MJ
    Lin, CF
    Chern, MY
    IEEE ELECTRON DEVICE LETTERS, 2000, 21 (12) : 601 - 603