Determining Base Transit Time of anAlyGa1-yAs HBT using the Analytical Model Developed for SiGe Device with Exponentially Doped Base

被引:0
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作者
Arafat, Yeasir [1 ]
Mannan, Rowshon Ara [2 ]
Biswas, Priyanka [2 ]
Jahan, Nusrat [2 ]
机构
[1] BUET, Dept Elect & Elect Engn, Dhaka, Bangladesh
[2] MIST, Dept Elect Elect & Elect Engn, Dhaka, Bangladesh
来源
2014 INTERNATIONAL CONFERENCE ON ELECTRONICS AND COMMUNICATION SYSTEMS (ICECS) | 2014年
关键词
Base transit time of AlGaAs; ternary compound semiconductor HBT; graded base; exponential doping; PROFILE DESIGN CONSIDERATIONS; BIPOLAR-TRANSISTOR; SATURATION; INJECTION; MOBILITY;
D O I
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中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Base transit time (BTT) of a graded base AlGaAs Heterojunction Bipolar Transistor (HBT)has been determined by using the analytical model previously developed for a SiGe HBT (arafatetaL).While thinking about the expansion of the SiGe BTT model for any other ternary compound semiconductor material like AlGaAs, the previous model could not be used directly because most of the parameters used in the model depend on the materials used. The novel part of the present work is that the authors investigated published literature for those parameters associated with AlGaAs and fed them into the SiGe model, determined the BTT and verified the results.
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页数:5
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