Defect density dependence of luminescence efficiency and lifetimes in AlGaN active regions exhibiting enhanced emission from nanoscale compositional inhomogeneities

被引:4
作者
Garrett, G. A. [1 ]
Sampath, A. V. [1 ]
Collins, C. J. [1 ]
Readinger, E. D. [1 ]
Sarney, W. L. [1 ]
Shen, H. [1 ]
Wraback, M. [1 ]
SoukhoveW, V. [2 ]
Usikov, A. [2 ]
Dmitriev, V. [2 ]
机构
[1] USA, Res Lab, Sensors & Elect Devices Directorate, Adelphi, MD USA
[2] Technol & Devices Int Inc, Silver Spring, MD USA
来源
PHYSICA STATUS SOLIDI C - CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 3, NO 6 | 2006年 / 3卷 / 06期
关键词
D O I
10.1002/pssc.200565448
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
AlGaN epilayers grown by plasma-assisted molecular beam epitaxy and exhibiting high internal quantum efficiency (up to 30%) are incorporated into double-heterostructure devices grown on base layers of varying defect density. Growth of these AlGaN active layers, having increased emission from localization of carriers in regions of nanoscale compositional inhomogeneities, is found to benefit from base layers of reduced defect density, including thick AlGaN templates grown by hydride vapor phase epitaxy. Nonlinear radiative processes are observed at high optical excitation for layers grown on lower defect base layers. (c) 2006 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
引用
收藏
页码:2125 / 2128
页数:4
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