Structural and compositional study of B-C-N films produced by laser ablation of B4C targets in N2 atmosphere

被引:52
作者
Laidani, N
Anderle, M
Canteri, R
Elia, L
Luches, A
Martino, M
Micheli, V
Speranza, G
机构
[1] ITC, Ist Ric Sci & Tecn, Div Fis Chim Superfici Interfacce, I-38050 Trent, Italy
[2] Ist Nazl Fis Mat, I-73100 Lecce, Italy
[3] Univ Lecce, Dipartimento Fis, I-73100 Lecce, Italy
关键词
boron carbon nitride; laser ablation; thin films; structure;
D O I
10.1016/S0169-4332(99)00559-0
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
In this work, we report on a structural and compositional characterization of B-C-N thin films deposited by laser reactive ablation of a B4C target, in low-pressure (5 Pa) nitrogen atmosphere. For target ablation, a KrF excimer laser (lambda = 248 nm, tau = 20 ns) has been used, at the fluences of 6 and 12 J/cm(2). Films have been deposited on silicon (100) substrates at room temperature. Scanning electron miroscopy (SEM), Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), time-of-night secondary ion mass spectrometry (ToF-SIMS), and Fourier transform-infrared spectroscopy (FT-IR) characterization techniques were used to analyze the composition and the structure of the deposited films. The film results to be a mixture of sp(2)/sp(3) BN and sp(2)/sp(3) nitrogenated C phases. The concentration of the different BN phases depends on the used laser fluence for the deposition of the film. (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:135 / 144
页数:10
相关论文
共 32 条
  • [1] ACQUIAVIVA S, IN PRESS APPL PHYS A
  • [2] VIBRATIONAL PROPERTIES OF AMORPHOUS SI AND GE
    ALBEN, R
    WEAIRE, D
    SMITH, JE
    BRODSKY, MH
    [J]. PHYSICAL REVIEW B, 1975, 11 (06) : 2271 - 2296
  • [3] Infra-red emission characterization of polycrystalline diamond films
    Ayres, VM
    McCormick, T
    Alexander, WB
    Vestyck, DJ
    Butler, JE
    Spiberg, P
    [J]. DIAMOND AND RELATED MATERIALS, 1998, 7 (06) : 789 - 793
  • [4] BENNINGHOVEN A, 1993, ANAL CHEM, V65, P630
  • [5] FORMATION OF C-N THIN-FILMS BY ION-BEAM DEPOSITION
    BOYD, KJ
    MARTON, D
    TODOROV, SS
    ALBAYATI, AH
    KULIK, J
    ZUHR, RA
    RABALAIS, JW
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1995, 13 (04): : 2110 - 2122
  • [6] Briggs D., 1983, PRACTICAL SURFACE AN, P87
  • [7] BRIGGS D, 1983, PRACTICAL SURFACE AN, P359
  • [8] COLTHUP NB, 1969, INTRO INFRA RED RAMA
  • [9] DAVIS LE, 1978, HDB AUGER ELECT SPEC
  • [10] NORMAL MODES IN HEXAGONAL BORON NITRIDE
    GEICK, R
    PERRY, CH
    RUPPRECH.G
    [J]. PHYSICAL REVIEW, 1966, 146 (02): : 543 - &