Double-tip piezoresponse force microscopy for quantitative measurement of the piezoelectric coefficient at the nanoscale

被引：6
|
作者：
Pan, K. [1 ,2 ]
Liu, Y. M. [3 ]
Peng, J. L. [1 ,2 ]
Liu, Y. Y. [1 ,2 ]
机构：
[1] Xiangtan Univ, Minist Educ, Key Lab Low Dimens Mat & Applicat Technol, Xiangtan 411105, Hunan, Peoples R China
[2] Xiangtan Univ, Fac Mat Optoelect & Phys, Xiangtan 411105, Hunan, Peoples R China
[3] Univ Washington, Dept Mech Engn, Seattle, WA 98195 USA
来源：
EPL | 2013年 / 104卷 / 06期
关键词：
MECHANICAL ENERGY; DOMAIN-STRUCTURES;
D O I：
10.1209/0295-5075/104/67001
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
Since the rotational symmetry of an electric field induced by piezoresponse force microscopy (PFM) can be broken and tuned by a scanning probe microscope (SPM) using multiple tips, a double-tip PFM measurement method is proposed to quantitatively determine the piezoelectric coefficient d(33) at the nanoscale, realized by modulating the spacing or voltage ratio between two SPM tips. Compared to the traditional PFM using a single SPM tip, the piezoelectric coefficient measured by the double-tip method agrees much better with the intrinsic value. Copyright (C) EPLA, 2013
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页数：5
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