Positronium formation from porous silica in backscattering and transmission geometries

被引：11

作者：

Andersen, Soren L. ^{[1
]}

Johansen, Rasmus R. ^{[1
]}

Overgaard, Jakob B. ^{[1
]}

Mortensen, Johan K. ^{[1
]}

Andersen, Kristoffer K. ^{[1
]}

Thomsen, Heine D. ^{[1
]}

Lund, Mikkel D. ^{[1
]}

Chevallier, Jacques ^{[1
]}

Knudsen, Helge ^{[1
]}

Uggerhoj, Ulrik I. ^{[1
]}

机构：

[1] Aarhus Univ, Dept Phys & Astron, DK-8000 Aarhus C, Denmark

来源：

EUROPEAN PHYSICAL JOURNAL D | 2014年 / 68卷 / 05期

关键词：

THIN-FILMS;

D O I：

10.1140/epjd/e2014-40762-x

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The Aarhus positron beam line is utilised to measure the positronium formation fraction from porous silica thin films created by the Glancing Angle Deposition technique. The highest formation fraction found from these studies in a backscattering geometry is (57.7 +/- 1.0)% in good agreement with other measurements. In transmission mode, the maximum positronium output is found to be (12.5 +/- 0.5)%. These are the first measurements of positronium formation in transmission of a porous silica thin film, a starting point for future attempts to optimise the positronium formation in transmission.

引用

页数：6

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