Beam Conditioning in Cutting Edge X-ray Analytical Equipment.

被引:0
|
作者
Graf, Juergen [1 ]
Kleine, Andreas [1 ]
Wiesmann, Joerg [1 ]
Michaelsen, Carsten [1 ]
机构
[1] Incoatec GmbH, Geesthacht, Germany
来源
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2013年 / 69卷
关键词
X-ray optics; multilayer thin films; new XRD technology;
D O I
10.1107/S0108767313095834
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
MS21-P01
引用
收藏
页码:S482 / S482
页数:1
相关论文
共 50 条
  • [41] MICROFOCUS X-RAY MAGNIFICATION EQUIPMENT
    ISAACSON, B
    MATERIALS EVALUATION, 1983, 41 (02) : A10 - A10
  • [42] X-RAY EQUIPMENT FOR VETERINARY PRACTICE
    DOUGLAS, SW
    VETERINARY RECORD, 1978, 103 (05) : 88 - 90
  • [43] EQUIPMENT FOR X-RAY STRUCTURAL INVESTIGATIONS
    UMANSKII, MM
    KHEIKER, DM
    INSTRUMENTS AND EXPERIMENTAL TECHNIQUES-USSR, 1971, 14 (03): : 665 - +
  • [44] MILITARY FIELD X-RAY EQUIPMENT
    AMORY, HI
    SMITH, SW
    RADIOLOGY, 1952, 59 (06) : 879 - 892
  • [45] CENTRING EQUIPMENT FOR X-RAY DIFFRACTOMETERS AND X-RAY CAMERAS USED WITH MONOCHROMATORS
    RASMUSSE.SE
    HENRIKSE.K
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1970, 3 : 101 - &
  • [46] Use of active-edge silicon detectors as X-ray beam monitors
    Kenney, C. J.
    Hasi, J.
    Parker, Sherwood
    Thompson, A. C.
    Westbrook, E.
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2007, 582 (01): : 178 - 181
  • [47] Tomographic Measurement of X-Ray Beam Spot Profiles Using a Rotating Edge
    Star-Lack, J.
    Etmektzoglou, T.
    Davidi, R.
    Abel, E.
    Sun, M.
    Virshup, G.
    Kielar, K.
    Fahrig, R.
    MEDICAL PHYSICS, 2012, 39 (06) : 4002 - 4002
  • [48] Dual edge apparatus and algorithm for measurement of x-ray beam spot parameters
    Jeung, Andrew
    Zhu, Liangjia
    Cassese, Marcelo
    Luevano, Roberto
    Star-Lack, Josh
    MEDICAL PHYSICS, 2018, 45 (11) : 5080 - 5093
  • [49] Beam hardening: Analytical considerations of the effective attenuation coefficient of x-ray tomography
    Alles, J.
    Mudde, R. F.
    MEDICAL PHYSICS, 2007, 34 (07) : 2882 - 2889
  • [50] Study on influence of X-ray beam spot intensity on EDXRF analytical precision
    School of Sciences, Changchun University of Science and Technology, Changchun
    Jilin
    130022, China
    Guangxue Xuebao, 2