Waveguide mode imaging and dispersion analysis with terahertz near-field microscopy

被引：51

作者：

Mitrofanov, Oleg ^{[1
,2
]}

Tan, Thomas ^{[1
]}

Mark, Paul R. ^{[3
]}

Bowden, Bradley ^{[3
]}

Harrington, James A. ^{[3
]}

机构：

[1] UCL, Dept Elect & Elect Engn, London WC1E 7JE, England

[2] London Ctr Nanotechnol, London WC1H 0AH, England

[3] Rutgers State Univ, Dept Mat Sci & Engn, Piscataway, NJ 08854 USA

来源：

APPLIED PHYSICS LETTERS | 2009年 / 94卷 / 17期

关键词：

submillimetre wave imaging; submillimetre wave propagation; terahertz wave imaging; terahertz waves; waveguides; RADIATION; TRANSMISSION; PROPAGATION; FIBERS;

D O I：

10.1063/1.3126053

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Propagation of terahertz waves in hollow metallic waveguides depends on the waveguide mode. Near-field scanning probe terahertz microscopy is applied to identify the mode structure and composition in dielectric-lined hollow metallic waveguides. Spatial profiles, relative amplitudes, and group velocities of three main waveguide modes are experimentally measured and matched to the HE11, HE12, and TE11 modes. The combination of near-field microscopy with terahertz time-resolved spectroscopy opens the possibility of waveguide mode characterization in the terahertz band.

引用

页数：3

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