Atomic Force Microscopy as a Characterization Tool for Contact Lenses: Indentation Tests and Grain Analysis

被引:7
作者
Caglayan, Mustafa Oguzhan [1 ]
机构
[1] Cumhuriyet Univ, Nanotechnol Engn Dept, TR-58140 Sivas, Turkey
关键词
grain analysis; force spectroscopy; soft contact lenses; AFM; Pico-indentation;
D O I
10.1080/00914037.2013.854242
中图分类号
TB3 [工程材料学]; R318.08 [生物材料学];
学科分类号
0805 ; 080501 ; 080502 ;
摘要
Nondestructive methods for testing mechanical properties of soft contact lenses allow quality control and testing to be performed on same sample by considering various parameters. A novel alternative to conventional mechanical test technique for contact lenses is presented implementing atomic force microscopy (AFM) and force spectroscopy (FS) technique as pico-indentation and mechanical characterization tool. This technique gives nN force resolution with producing nm range elastic deformation. FS and AFM topography results are evaluated simultaneously to compare mechanical and topographical properties of contact lenses such as Young's modulus, grain size evaluation, surface roughness, and adhesion force. Mechanical properties of soft contact lenses were reported by considering equilibrium water content of contact lens.
引用
收藏
页码:680 / 684
页数:5
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