Flexible Chip-Scale Package and Interconnect for Implantable MEMS Movable Microelectrodes for the Brain

被引:28
作者
Jackson, Nathan [1 ]
Muthuswamy, Jit [1 ]
机构
[1] Arizona State Univ, Harrington Dept Bioengn, Tempe, AZ 85287 USA
关键词
Biomedical microdevices; bio-microelectromechanical systems (MEMS); brain implants; microflex technology; neural prostheses; polyimide; FLIP-CHIP; ELECTRICAL CHARACTERIZATION; BONDING TECHNIQUE; SILICON; FABRICATION; FILM; THIN; STRENGTH; SENSORS; DESIGN;
D O I
10.1109/JMEMS.2009.2013391
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We report here a novel approach called microelectromechanical systems (MEMS) microflex interconnect (MMFI) technology for packaging a new generation of Bio-MEMS devices that involve movable microelectrodes implanted in brain tissue. MMFI addresses the need for the following: 1) operating space for movable parts and 2) flexible interconnects for mechanical isolation. We fabricated a thin polyimide substrate with embedded bond pads, vias, and conducting traces for the interconnect with a backside dry etch, so that the flexible substrate can act as a thin-film cap for the MEMS package. A double-gold-stud-bump rivet-bonding mechanism was used to form electrical connections to the chip and also to provide a spacing of approximately 15-20 mu m for the movable parts. The MMFI approach achieved a chip-scale package that is lightweight and biocompatible and has flexible interconnects and no underfill. Reliability tests demonstrated minimal increases of 0.35, 0.23, and 0.15 m Omega in mean contact resistances under high humidity, thermal cycling, and thermal shock conditions, respectively. High-temperature tests resulted in increases of > 90 and similar to 4.2 m Omega in resistance when aluminum and gold bond pads were used, respectively. The mean time to failure was estimated to be at least one year under physiological conditions. We conclude that MMFI technology is a feasible and reliable approach for packaging and interconnecting Bio-MEMS devices.
引用
收藏
页码:396 / 404
页数:9
相关论文
共 41 条
  • [1] New observations on intermetallic compound formation in gold ball bonds:: general growth patterns and identification of two forms of Au4Al
    Breach, CD
    Wulff, F
    [J]. MICROELECTRONICS RELIABILITY, 2004, 44 (06) : 973 - 981
  • [2] Brown W.D., 1999, ADV ELECT PACKAGING
  • [3] Electrical characterization of NCP- and NCF-bonded fine-pitch flip-chip-on-flexible packages
    Chan, Y. C.
    Tan, S. C.
    Lui, Nelson S. M.
    Tan, C. W.
    [J]. IEEE TRANSACTIONS ON ADVANCED PACKAGING, 2006, 29 (04): : 735 - 740
  • [4] Design and development of a package using LCP for RF/microwave MEMS switches
    Chen, Morgan Jikang
    Pham, Anh-Vu H.
    Evers, Nicole Andrea
    Kapusta, Chris
    Iannotti, Joseph
    Kornrumpf, William
    Maciel, John J.
    Karabudak, Nafiz
    [J]. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2006, 54 (11) : 4009 - 4015
  • [5] Localized silicon fusion and eutectic bonding for MEMS fabrication and packaging
    Cheng, YT
    Lin, LW
    Najafi, K
    [J]. JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, 2000, 9 (01) : 3 - 8
  • [6] Cheng YT, 1999, PROC IEEE MICR ELECT, P285, DOI [10.1109/MEMSYS.1999.746837, 10.1109/SSDM.1999.787652]
  • [7] Accelerated hermeticity testing of a glass-silicon package formed by rapid thermal processing aluminum-to-silicon nitride bonding
    Chiao, M
    Lin, LW
    [J]. SENSORS AND ACTUATORS A-PHYSICAL, 2002, 97-8 : 405 - 409
  • [8] DOKMECI M, 1997, P 9 INT C SOL STAT S, P244
  • [9] Horsting C. W., 1972, Proceedings of the 10th Annual Conference on Reliability Physics 1972, P155
  • [10] Packaging design of microsystems and meso-scale devices
    Hsu, TR
    [J]. IEEE TRANSACTIONS ON ADVANCED PACKAGING, 2000, 23 (04): : 596 - 601