共 26 条
[1]
Bo L I, 2009, Systems Engineering-Theory & Practice, V29, P100
[2]
Caruso H., 1998, Reliability and Maintainability Symposium (RAMS) Proceedings, IEEE, P389
[4]
Chen J, 2007, J NANJING I TECHNOLO, V1, P1
[5]
Accelerated temperature cycle test and Coffin-Manson model for electronic packaging
[J].
ANNUAL RELIABILITY AND MAINTAINABILITY SYMPOSIUM, 2005 PROCEEDINGS,
2005,
:556-560
[6]
Deng J. L., 2005, BASIC METHODS GRAY S
[7]
Deppe R. W., 1994, Annual Reliability and Maintainability Symposium. 1994 Proceedings (Cat. No.94CH3391-0), P91, DOI 10.1109/RAMS.1994.291088
[10]
He Qingfei, 2013, China Mechanical Engineering, V24, P500, DOI 10.3969/j.issn.1004-132X.2013.04.013