Effects of electrode material and configuration on the characteristics of planar resistive switching devices

被引:27
作者
Peng, H. Y. [1 ,2 ]
Pu, L. [1 ]
Wu, J. C. [3 ]
Cha, D. [4 ]
Hong, J. H. [4 ]
Lin, W. N.
Li, Y. Y. [1 ,5 ]
Ding, J. F. [5 ]
David, A. [1 ]
Li, K.
Wu, T. [5 ]
机构
[1] Nanyang Technol Univ, Sch Phys & Math Sci, Div Phys & Appl Phys, Singapore 637371, Singapore
[2] Toshiba Co Ltd, Corp Res & Dev Ctr, Adv LSI Technol Lab, Kawasaki, Kanagawa 2128582, Japan
[3] Sichuan Univ, Inst Nucl Sci & Technol, Key Lab Radiat Phys & Technol, Minist Educ, Chengdu 610064, Peoples R China
[4] King Abdullah Univ Sci & Technol, Imaging & Characterizat Core Lab, Thuwal 23955, Saudi Arabia
[5] King Abdullah Univ Sci & Technol, Thuwal 23955, Saudi Arabia
关键词
MEMORY APPLICATIONS; RESISTANCE; FILMS; NANODEVICES; SRTIO3;
D O I
10.1063/1.4827597
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We report that electrode engineering, particularly tailoring the metal work function, measurement configuration and geometric shape, has significant effects on the bipolar resistive switching (RS) in lateral memory devices based on self-doped SrTiO3 (STO) single crystals. Metals with different work functions (Ti and Pt) and their combinations are used to control the junction transport (either ohmic or Schottky-like). We find that the electric bias is effective in manipulating the concentration of oxygen vacancies at the metal/STO interface, influencing the RS characteristics. Furthermore, we show that the geometric shapes of electrodes (e. g., rectangular, circular, or triangular) affect the electric field distribution at the metal/oxide interface, thus plays an important role in RS. These systematic results suggest that electrode engineering should be deemed as a powerful approach toward controlling and improving the characteristics of RS memories. (C) 2013 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution 3.0 Unported License.
引用
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页数:7
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