Reconstruction of surface topographies by scanning electron microscopy for application in fracture research

被引：85

作者：

Stampfl, J ^{[1
]}

Scherer, S ^{[1
]}

Gruber, M ^{[1
]}

Kolednik, O ^{[1
]}

机构：

[1] TU GRAZ,INST COMP UNTERSTUTZTE GEOMETRIE & GRAPH,A-8010 GRAZ,AUSTRIA

来源：

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 1996年 / 63卷 / 04期

关键词：

D O I：

10.1007/BF01567324

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Stereoscopic scanning electron micrographs can be used to reconstruct the microscopic topography of material surfaces. By applying a system for automatic image processing we can obtain Digital Elevation Models (DEMs) of the investigated surface. These DEMs are used to measure the degree of deformation on metallic fracture surfaces. By modelling the deformation the amount of plastic energy that is necessary to shape the microductile fracture surface can be calculated. These values are compared with experimentally obtained results.

引用

页码：341 / 346

页数：6

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