A powerful scanning methodology for 3D measurements of small parts with complex surfaces and sub millimeter-sized features, based on close range photogrammetry

被引:32
作者
Galantucci, L. M. [1 ]
Pesce, M. [1 ]
Lavecchia, F. [2 ]
机构
[1] Politecn Bari, Dipartimento Meccan Matemat & Management, I-70126 Bari, Italy
[2] Polishape 3D Srl, Dipartimento Meccan Matemat & Management, I-70126 Bari, Italy
来源
PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY | 2016年 / 43卷
关键词
Close-range photogrammetry; Non-contact system; 3D digital model; 3D measurements; Sub-millimeter; Complex surfaces; MICRO-CT; DIMENSIONAL MICRO; METROLOGY;
D O I
10.1016/j.precisioneng.2015.07.010
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A powerful and cost effective photogrammetric scanning methodology, suitable for reconstructing a full 3D digital model of parts with complex surfaces and sub millimeter-sized features, is described. The scanner employed for this purpose is composed of a computerized system that drives and control the movements of a rotary table, and a digital SLR camera for the images acquisition. The object is positioned on the rotary table that rotates at fixed angles, while the digital camera, mounted on the stator through a rigid frame, captures the images. The scanning process has been optimized with the aim to minimize the number of shots and thus, the time needed to obtain a complete 3D digital model, which is not dependent from the dimensions of the object. With the aim to demonstrate the effectiveness of the proposed scanning methodology, four benchmarks have been realized to provide complex examples. The 3D digital models were compared with those obtained with an OptimetTM Conoscan 4000 which uses a conoscopic holographic sensor. (C) 2015 Elsevier Inc. All rights reserved.
引用
收藏
页码:211 / 219
页数:9
相关论文
共 32 条
[11]  
Galantucci L., 2006, Revue internationale d'ingenierie numerique, V2, P29
[12]   Multistack Close Range Photogrammetry for Low Cost Submillimeter Metrology [J].
Galantucci, L. M. ;
Lavecchia, F. ;
Percoco, G. .
JOURNAL OF COMPUTING AND INFORMATION SCIENCE IN ENGINEERING, 2013, 13 (04)
[13]  
Goo C.S., 2012, J MANUF PROCESS, V14, P174, DOI [10.1016/j.jmapro.2011.11.006, DOI 10.1016/J.JMAPRO.2011.11.006]
[14]   Dimensional micro and nano metrology [J].
Hansen, H. N. ;
Carneiro, K. ;
Haitjema, H. ;
De Chiffre, L. .
CIRP ANNALS-MANUFACTURING TECHNOLOGY, 2006, 55 (02) :721-743
[15]  
Hemmleb M., 2000, INT ARCH PHOTOGRAMME, V33, P56
[16]  
Hemmleb M, 1996, INT ARCH PHOTOGRAMM, VXXXI, P225
[17]   A comparison of micro CT with other techniques used in the characterization of scaffolds [J].
Ho, ST ;
Hutmacher, DW .
BIOMATERIALS, 2006, 27 (08) :1362-1376
[18]   Electrical probing for dimensional micro metrology [J].
Hoffmann, J. ;
Weckenmann, A. ;
Sun, Z. .
CIRP JOURNAL OF MANUFACTURING SCIENCE AND TECHNOLOGY, 2008, 1 (01) :59-62
[19]   Multi-image 3D reconstruction data evaluation [J].
Koutsoudis, Anestis ;
Vidmar, Blaz ;
Ioannakis, George ;
Arnaoutoglou, Fotis ;
Pavlidis, George ;
Chamzas, Christodoulos .
JOURNAL OF CULTURAL HERITAGE, 2014, 15 (01) :73-79
[20]   Distinctive image features from scale-invariant keypoints [J].
Lowe, DG .
INTERNATIONAL JOURNAL OF COMPUTER VISION, 2004, 60 (02) :91-110