Subwavelength microwave electric-field imaging using Rydberg atoms inside atomic vapor cells

被引：133

作者：

Fan, H. Q. ^{[1
]}

Kumar, S. ^{[1
]}

Daschner, R. ^{[2
]}

Kuebler, H. ^{[1
,2
]}

Shaffer, J. P. ^{[1
]}

机构：

[1] Univ Oklahoma, Homer L Dodge Dept Phys & Astron, Norman, OK 73019 USA

[2] Univ Stuttgart, Inst Phys, D-70550 Stuttgart, Germany

来源：

OPTICS LETTERS | 2014年 / 39卷 / 10期

关键词：

ELECTROMAGNETICALLY INDUCED TRANSPARENCY; NEAR-FIELD; METAMATERIALS; RESONANCES; STANDARDS;

D O I：

10.1364/OL.39.003030

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We have recently shown [Nat. Phys. 8, 819 (2012)] that Alkali atoms contained in a vapor cell can serve as a highly accurate standard for microwave (MW) electric field strength as well as polarization. Here we show for the first time that Rydberg atom electromagnetically induced transparency can be used to imageMW electric fields with unprecedented precision. The spatial resolution of the method is far into the subwavelength regime similar to lambda/650 or 66 mu m at 6.9 GHz. The electric field resolutions are similar to those we have already demonstrated similar to 50 mu V cm(-1). Our experimental results agree with finite element calculations of test electric-field patterns. (C) 2014 Optical Society of America

引用

页码：3030 / 3033

页数：4

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