Research on Texture Defect Detection Based on Faster-RCNN and Feature Fusion

被引:8
作者
Lin, Zhongkang [1 ]
Guo, Zhiqiang [1 ]
Yang, Jie [1 ]
机构
[1] Wuhan Univ Technol, Sch Informat Engn, Wuhan, Hubei, Peoples R China
来源
ICMLC 2019: 2019 11TH INTERNATIONAL CONFERENCE ON MACHINE LEARNING AND COMPUTING | 2019年
基金
中国国家自然科学基金;
关键词
defect detection; faster-RCNN; feature fusion; target location;
D O I
10.1145/3318299.3318341
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
Product texture defect detection is one of the important quality inspection procedures in industrial production. For the traditional defect detection methods, the detection processes are cumbersome, the accuracies are not high, and the generalizations are not strong. This paper proposes a method based on Faster-RCNN and feature fusion. This method uses the ResNet network model to extract the shared convolution feature, and combines the high-level features of the ROI pooling layer output with the low-level features obtained by the direction gradient histogram (HOG) as full connection layer input. Then, optimizing the model by adjusting the training parameters and convolutional neural network structure. Experiments on the German Pattern Recognition Association (GAPR) texture defect dataset show that the proposed model has improved in the mAP index. Through the migration learning strategy, experiments are carried out on several sets of actually collected data sets. The experimental results show that the model has good adaptability and can be applied to the surface defect detection of workpieces under different conditions.
引用
收藏
页码:429 / 433
页数:5
相关论文
共 15 条
[1]  
[曹诗雨 Cao Shiyu], 2017, [中国图象图形学报, Journal of Image and Graphics], V22, P671
[2]  
Cheng Wansheng, 2005, RES SURFACE DEFECT D
[3]  
Dai C., 2017, Journal of Computer Applications, V37, P85
[4]  
Fu Ruonan, 2017, RES TARGET DETECTION
[5]  
Girshick R., 2014, IEEE COMP SOC C COMP, DOI [10.1109/CVPR.2014.81, DOI 10.1109/CVPR.2014.81]
[6]   Fast R-CNN [J].
Girshick, Ross .
2015 IEEE INTERNATIONAL CONFERENCE ON COMPUTER VISION (ICCV), 2015, :1440-1448
[7]   ImageNet Classification with Deep Convolutional Neural Networks [J].
Krizhevsky, Alex ;
Sutskever, Ilya ;
Hinton, Geoffrey E. .
COMMUNICATIONS OF THE ACM, 2017, 60 (06) :84-90
[8]  
Liang Hu, 2005, KEY TECHNOLOGY ONLIN
[9]   Fabric defect detection using morphological filters [J].
Mak, K. L. ;
Peng, P. ;
Yiu, K. F. C. .
IMAGE AND VISION COMPUTING, 2009, 27 (10) :1585-1592
[10]  
Rui Chen, 2015, INFORM TECHNOLOGY, P101