Transmission electron microscopy of interfaces in structural ceramic composites

被引:0
作者
Knowles, KM
Turan, S
Kumar, A
Chen, SJ
Clegg, WJ
机构
[1] Univ Cambridge, Dept Mat Sci & Met, Cambridge CB2 3QZ, England
[2] Anadolu Univ, Iki Eylul Kampusu, Seramik Muhendisligi Bolumu, TR-26470 Eskisehir, Turkey
[3] IBM Corp, Storage Syst Div, San Jose, CA 95193 USA
[4] Univ Calif Berkeley, Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA
来源
JOURNAL OF MICROSCOPY-OXFORD | 1999年 / 196卷
关键词
ceramics; chemical analysis; composites; fibres; interfaces; laminates; particles; transmission electron microscopy;
D O I
暂无
中图分类号
TH742 [显微镜];
学科分类号
摘要
Ceramic composites based either on a particulate, fibre or a lamellar architecture are potentially useful as damage-tolerant high-temperature engineering materials. The ability of the interfaces in such systems to deflect cracks is vital to the damage tolerance of these materials. Transmission electron microscopy techniques enable the chemical and physical characterization of these interfaces, providing information on interlayer thicknesses, chemical species, local bonding and the microstructural features which give rise to the interfacial properties, thereby enabling a full understanding not only of composites after processing, but also after exposure to aggressive environments such as air at high temperature. Examples of the application of transmission electron microscopy to all three composite architectures are described.
引用
收藏
页码:194 / 202
页数:9
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